中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
INVESTIGATION OF THICKNESS AND ELECTRICAL RESISTIVITY OF THE CURRENT SHEETS IN SOLAR ERUPTIONS

文献类型:期刊论文

作者Lin J(林隽)1,2; Li, J3; Ko, YK2; Raymond, JC2
刊名ASTROPHYSICAL JOURNAL
出版日期2009-03-10
卷号693期号:2页码:1666-1677
关键词diffusion Sun: coronal mass ejections (CMEs) Sun: flares Sun: magnetic fields turbulence
ISSN号0004-637X
产权排序第一完成单位
通讯作者Lin, J (reprint author), Chinese Acad Sci, Yunnan Astron Observ, Natl Astron Observ China, POB 110, Kunming 650011, Yunnan, Peoples R China.
英文摘要A discussion of the thickness of current sheets in solar eruptions, d, led Lin et al. in 2007 to estimate very large values for the effective resistivity, eta(e). Here, we address some questions raised by that paper. We apply the limb synoptic map technique and find d between 5.0 x 10(4) and 4.6 x 10(5) km, increasing with both time and altitude. The possibility that large apparent d and eta(e) result from projection effects is examined and rejected. We derive theoretical scaling laws relating d to other observables that corroborate this conclusion and thus help confine both d and eta(e) to a reasonable range. The possible impact of our results on the existing models of particle acceleration in reconnecting current sheets is also briefly discussed.
WOS标题词Science & Technology ; Physical Sciences
学科主题Astronomy & Astrophysics
类目[WOS]Astronomy & Astrophysics
研究领域[WOS]Astronomy & Astrophysics
关键词[WOS]CORONAL MASS EJECTIONS ; RECONNECTING CURRENT SHEETS ; MAGNETIC RECONNECTION ; PARTICLE-ACCELERATION ; TEARING MODE ; FIELD ; FLARES ; WIND ; TURBULENCE ; MECHANISM
收录类别SCI
原文出处http://iopscience.iop.org/0004-637X/693/2/1666/
语种英语
WOS记录号WOS:000264095100057
公开日期2016-05-03
源URL[http://ir.ynao.ac.cn/handle/114a53/6146]  
专题云南天文台_太阳物理研究组
作者单位1.National Astronomical Observatories of China/Yunnan Astronomical Observatory, Chinese Academy of Sciences, P.O. Box 110, Kunming, Yunnan 650011, China
2.Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, MA 02138, USA
3.Institute for Astronomy, University of Hawaii, Honolulu, HI 96822, USA
推荐引用方式
GB/T 7714
Lin J,Li, J,Ko, YK,et al. INVESTIGATION OF THICKNESS AND ELECTRICAL RESISTIVITY OF THE CURRENT SHEETS IN SOLAR ERUPTIONS[J]. ASTROPHYSICAL JOURNAL,2009,693(2):1666-1677.
APA Lin J,Li, J,Ko, YK,&Raymond, JC.(2009).INVESTIGATION OF THICKNESS AND ELECTRICAL RESISTIVITY OF THE CURRENT SHEETS IN SOLAR ERUPTIONS.ASTROPHYSICAL JOURNAL,693(2),1666-1677.
MLA Lin J,et al."INVESTIGATION OF THICKNESS AND ELECTRICAL RESISTIVITY OF THE CURRENT SHEETS IN SOLAR ERUPTIONS".ASTROPHYSICAL JOURNAL 693.2(2009):1666-1677.

入库方式: OAI收割

来源:云南天文台

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