The photon scanning tunneling microscope and its applications
文献类型：会议论文
| 作者 | Yao JE ; Guo N ; Gao S ; Wu SF ; Xia DK ; Shang GY ; Chu SC ; Li CJ ; He J ; Xu SH |
| 出版日期 | 1997 |
| 会议名称 | 14th international congress on x-ray optics and microanalysis (icxom) |
| 会议日期 | aug 29-sep 02, 1995 |
| 会议地点 | guangzhou, peoples r china |
| 关键词 | photon scanning tunneling microscope scanning near-field optical microscope OPTICAL MICROSCOPY |
| 页码 | 621-628 |
| 通讯作者 | yao je acad sinica beijing lab electron microscopy pob 2724 beijing 100080 peoples r china. |
| 中文摘要 | a simple photon scanning tunneling microscope (pstm) is described. its lateral resolution (similar to 10nm with a maximal scanning range of 10 mu m x 10 mu m ) is much better than that of a conventional optical microscope. its principle, the fiber optic tip fabrication and pstm images of different samples such as mica, hdpe and linbo3 are presented. |
| 英文摘要 | a simple photon scanning tunneling microscope (pstm) is described. its lateral resolution (similar to 10nm with a maximal scanning range of 10 mu m x 10 mu m ) is much better than that of a conventional optical microscope. its principle, the fiber optic tip fabrication and pstm images of different samples such as mica, hdpe and linbo3 are presented.; 于2010-11-15批量导入; zhangdi于2010-11-15 17:02:40导入数据到semi-ir的ir; made available in dspace on 2010-11-15t09:02:40z (gmt). no. of bitstreams: 1 3070.pdf: 1232290 bytes, checksum: e11f9dc45738e2bb131d86a9a5dd37eb (md5) previous issue date: 1997; acad sinica, beijing lab electron microscopy, beijing 100080, peoples r china; dalian univ technol, dept phys, dalian 116023, liaoning, peoples r china; acad sinica, inst semicond, beijing 100083, peoples r china |
| 收录类别 | CPCI-S |
| 会议录 | journal of trace and microprobe techniques, 15 (4)
 |
| 会议录出版者 | marcel dekker inc ; 270 madison ave, new york, ny 10016 usa |
| 学科主题 | 半导体化学 |
| 会议录出版地 | 270 madison ave, new york, ny 10016 usa |
| 语种 | 英语 |
| ISSN号 | 0733-4680 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/15101]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Yao JE,Guo N,Gao S,et al. The photon scanning tunneling microscope and its applications[C]. 见:14th international congress on x-ray optics and microanalysis (icxom). guangzhou, peoples r china. aug 29-sep 02, 1995. |
入库方式： OAI收割
来源：半导体研究所
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