Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling
文献类型：期刊论文
| 作者 | Cui, Ajuan1; Liu, Zhe2; Dong, Huanli1; Wang, Yujin2; Zhen, Yonggang1; Li, Wuxia2; Li, Junjie2; Gu, Changzhi2; Hu, Wenping1,3,4 |
| 刊名 | ADVANCED MATERIALS
 |
| 出版日期 | 2015-05-20 |
| 卷号 | 27期号:19页码:3002-3006 |
| 关键词 | focused ion beam milling molecular electronics nanogap electrodes |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2016-05-09 |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/28046]  |
| 专题 | 化学研究所_有机固体实验室 |
| 作者单位 | 1.Chinese Acad Sci, Beijing Natl Lab Mol Sci, Inst Chem, Key Lab Organ Solids, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100190, Peoples R China 3.Tianjin Univ, Sch Sci, Collaborat Innovat Ctr Chem Sci & Engn Tianjin, Tianjin 300072, Peoples R China 4.Tianjin Univ, Sch Sci, Dept Chem, Tianjin 300072, Peoples R China |
| 推荐引用方式 GB/T 7714 | Cui, Ajuan,Liu, Zhe,Dong, Huanli,et al. Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling[J]. ADVANCED MATERIALS,2015,27(19):3002-3006. |
| APA | Cui, Ajuan.,Liu, Zhe.,Dong, Huanli.,Wang, Yujin.,Zhen, Yonggang.,...&Hu, Wenping.(2015).Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling.ADVANCED MATERIALS,27(19),3002-3006. |
| MLA | Cui, Ajuan,et al."Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling".ADVANCED MATERIALS 27.19(2015):3002-3006. |
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来源：化学研究所
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