中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature

文献类型:期刊论文

作者Liu, Yan1,2; Zhu, Xuefeng1; Li, Mingrun1; Li, Wenping1,2; Yang, Weishen1
刊名journal of membrane science
出版日期2015-10-15
卷号492期号:1页码:173-180
关键词MIEC membrane Silicon impurity Low temperature Degradation Perovskite
通讯作者朱雪峰 ; 杨维慎
英文摘要the oxygen permeation flux of a mixed ionic-electronic conducting membrane bace0.1co0.4fe0.5o3-delta (bccf) decreased by 62% after 477 h on-stream operation under air/he gradient at 600 degrees c. to understand this phenomenon, the spent membrane was examined via several characterization techniques. scanning electron microscopy (sem) and energy dispersive x-ray (eds) analyses revealed that the surface of the sweep side has a higher silicon impurity content than that of the feed side. in fact, the bccf powder contained up to 140 ppm of silicon impurities, which originated from the original chemicals and/or was introduced during preparation of the material. after the 477 h operation at 600 degrees c, a similar to 25 nm-thick amorphous silicon-containing layer was detected by high resolution transmission electron microscopy (hrtem) on the sweep side surface of the spent membrane. a possible mechanism related to silicon migration from membrane bulk to surfaces was proposed to explain the degradation phenomenon. to overcome the negative effects of silicon impurity, a simple and effective method was proposed to stabilize the oxygen permeation fluxes at low temperatures, i.e. coating a porous sm0.5sr0.5coo3-delta (ssc) catalyst on both surfaces of the membrane to accommodate the silicon impurily and accelerate oxygen exchange kinetics. with this method, the oxygen permeation was stabilized for 500 h at 600 degrees c. (c) 2015 elsevier b.v. all rights reserved.
学科主题物理化学
WOS标题词science & technology ; technology ; physical sciences
类目[WOS]engineering, chemical ; polymer science
研究领域[WOS]engineering ; polymer science
关键词[WOS]oxygen permeable membrane ; dual-phase membranes ; mixed-oxide (a,b)o ; ceramic membranes ; cathode material ; structural stability ; hydrogen-production ; potential gradient ; co2 capture ; fuel-cells
收录类别SCI
语种英语
WOS记录号WOS:000358433600019
公开日期2016-05-09
源URL[http://cas-ir.dicp.ac.cn/handle/321008/143769]  
专题大连化学物理研究所_中国科学院大连化学物理研究所
作者单位1.Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Catalysis, Dalian 116023, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100039, Peoples R China
推荐引用方式
GB/T 7714
Liu, Yan,Zhu, Xuefeng,Li, Mingrun,et al. Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature[J]. journal of membrane science,2015,492(1):173-180.
APA Liu, Yan,Zhu, Xuefeng,Li, Mingrun,Li, Wenping,&Yang, Weishen.(2015).Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature.journal of membrane science,492(1),173-180.
MLA Liu, Yan,et al."Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature".journal of membrane science 492.1(2015):173-180.

入库方式: OAI收割

来源:大连化学物理研究所

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