An absolute phase technique for 3D profile measurement using four-step structured light pattern
文献类型:期刊论文
作者 | Xu, Jing1,2; Liu, Shaoli1; Wan, An1; Gao, Bingtuan3; Yi, Qiang1; Zhao, Danpu4; Luo, Ruikun1; Chen, Ken1 |
刊名 | OPTICS AND LASERS IN ENGINEERING |
出版日期 | 2012-09-01 |
卷号 | 50期号:9页码:1274-1280 |
关键词 | Structured light Relative phase Absolute phase |
英文摘要 | The aim of this paper is to develop a four-step pattern encoding strategy through the combination of a triangle waveform, a step waveform, and two square waveforms. The proposed pattern encoding strategy makes the range of unique phase distribution up to 10 pi, which is 5 times as large as 2 pi of conventional four-step phase shifting encoding approach. Therefore, the proposed encoding strategy enables the structured light-based measurement system to measure complicated objects without ambiguity, which is the common limitation of the phase shifting algorithms. Furthermore, the proposed strategy is a pixel-level method, leading to a high-density 3D reconstruction. The decoding approach is a pixel independent computation, which can eliminate the error propagation and enhance the reliability. The phase errors between the phase shifting and the proposed encoding strategy are compared by the numerical simulation and they are very close. Experiments with different objects are carried out to validate the robustness and accuracy for the proposed encoding strategy. The results show that it is efficient for the 3D reconstruction of complicated objects. (C) 2012 Elsevier Ltd. All rights reserved. |
WOS标题词 | Science & Technology ; Physical Sciences |
类目[WOS] | Optics |
研究领域[WOS] | Optics |
关键词[WOS] | SHAPE MEASUREMENT ; COMPENSATION ; PROFILOMETRY |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000305773200012 |
源URL | [http://ir.ia.ac.cn/handle/173211/10744] |
专题 | 自动化研究所_智能制造技术与系统研究中心_多维数据分析团队 |
作者单位 | 1.Tsinghua Univ, Dept Precis Instruments & Mechanol, Beijing 100084, Peoples R China 2.Tsinghua Univ, State Key Lab Tribol, Beijing 100084, Peoples R China 3.Southeast Univ, Sch Elect & Engn, Nanjing 210096, Peoples R China 4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China |
推荐引用方式 GB/T 7714 | Xu, Jing,Liu, Shaoli,Wan, An,et al. An absolute phase technique for 3D profile measurement using four-step structured light pattern[J]. OPTICS AND LASERS IN ENGINEERING,2012,50(9):1274-1280. |
APA | Xu, Jing.,Liu, Shaoli.,Wan, An.,Gao, Bingtuan.,Yi, Qiang.,...&Chen, Ken.(2012).An absolute phase technique for 3D profile measurement using four-step structured light pattern.OPTICS AND LASERS IN ENGINEERING,50(9),1274-1280. |
MLA | Xu, Jing,et al."An absolute phase technique for 3D profile measurement using four-step structured light pattern".OPTICS AND LASERS IN ENGINEERING 50.9(2012):1274-1280. |
入库方式: OAI收割
来源:自动化研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。