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作者 | Fred Y. Ye1; Mu-Hsuan Huang2; Dar-Zen Chen3
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刊名 | journal of data and information science
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出版日期 | 2016-06-17
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卷号 | 1期号:2页码:13-31 |
关键词 | Performance matrix
Trace metrics
h-index|h-core
I3
Bibliometrics
Patentometrics
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通讯作者 | dar-zhen chen (e-mail: dzchen@ntu.edu.tw).
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中文摘要 |
purpose: to comprehensively evaluate the overall performance of a group or an individual in both bibliometrics and patentometrics. design/methodology/approach: trace metrics were applied to the top 30 universities in the 2014 academic ranking of world universities (arwu) — computer sciences, the top 30 esi highly cited papers in the computer sciences field in 2014, as well as the top 30 assignees and the top 30 most cited patents in the national bureau of economic research (nber) computer hardware and software category. findings: we found that, by applying trace metrics, the research or marketing impact efficiency, at both group and individual levels, was clearly observed. furthermore, trace metrics were more sensitive to the different publication-citation distributions than the average citation and h-index were. research limitations: trace metrics considered publications with zero citations as negative contributions. one should clarify how he/she evaluates a zero-citation paper or patent before applying trace metrics. practical implications: decision makers could regularly examinine the performance of their university/company by applying trace metrics and adjust their policies accordingly. originality/value: trace metrics could be applied both in bibliometrics and patentometrics and provide a comprehensive view. moreover, the high sensitivity and unique impact efficiency view provided by trace metrics can facilitate decision makers in examining and adjusting their policies. |
英文摘要 |
purpose: to comprehensively evaluate the overall performance of a group or an individual in both bibliometrics and patentometrics. design/methodology/approach: trace metrics were applied to the top 30 universities in the 2014 academic ranking of world universities (arwu) — computer sciences, the top 30 esi highly cited papers in the computer sciences field in 2014, as well as the top 30 assignees and the top 30 most cited patents in the national bureau of economic research (nber) computer hardware and software category. findings: we found that, by applying trace metrics, the research or marketing impact efficiency, at both group and individual levels, was clearly observed. furthermore, trace metrics were more sensitive to the different publication-citation distributions than the average citation and h-index were. research limitations: trace metrics considered publications with zero citations as negative contributions. one should clarify how he/she evaluates a zero-citation paper or patent before applying trace metrics. practical implications: decision makers could regularly examinine the performance of their university/company by applying trace metrics and adjust their policies accordingly. originality/value: trace metrics could be applied both in bibliometrics and patentometrics and provide a comprehensive view. moreover, the high sensitivity and unique impact efficiency view provided by trace metrics can facilitate decision makers in examining and adjusting their policies. |
学科主题 | 新闻学与传播学
; 图书馆、情报与文献学
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收录类别 | 其他
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原文出处 | http://www.chinalibraries.net
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语种 | 英语
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源URL | [http://ir.las.ac.cn/handle/12502/8595]  |
专题 | 文献情报中心_Journal of Data and Information Science_Journal of Data and Information Science-2016
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作者单位 | 1.School of Information Management, Nanjing University, Nanjing 210023, China 2.Department of Library and Information Science, Taiwan University, Taipei 10617, China 3.Department of Mechanical Engineering and Institute of Industrial Engineering, Taiwan University, Taipei 10617, China
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推荐引用方式 GB/T 7714 |
Fred Y. Ye,Mu-Hsuan Huang,Dar-Zen Chen. Comparative Study of Trace Metrics between Bibliometrics and Patentometrics[J]. journal of data and information science,2016,1(2):13-31.
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APA |
Fred Y. Ye,Mu-Hsuan Huang,&Dar-Zen Chen.(2016).Comparative Study of Trace Metrics between Bibliometrics and Patentometrics.journal of data and information science,1(2),13-31.
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MLA |
Fred Y. Ye,et al."Comparative Study of Trace Metrics between Bibliometrics and Patentometrics".journal of data and information science 1.2(2016):13-31.
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