Scanning analysis of REE in bastnaesite with synchrotron radiation X-ray fluorescence microprobe
文献类型:期刊论文
作者 | An, QX; Wang, RB; Deng, SW; Pan, JX; Wu, YR![]() ![]() |
刊名 | JOURNAL OF RARE EARTHS
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出版日期 | 1996 |
卷号 | 14期号:4页码:308-311 |
关键词 | synchrotron radiation X-ray fluorescence rare earth analysis bastnaesite |
通讯作者 | NATL RES CTR GEOANAL,BEIJING 100037,PEOPLES R CHINA ; INST HIGH ENERGY PHYS,BEIJING 100039,PEOPLES R CHINA ; CHINESE ACAD GEOL SCI,INST MINERAL DEPOSITS,BEIJING 100037,PEOPLES R CHINA |
英文摘要 | The content of REE(La, Ce, Pr, Nd, Sm) in bastnaesite was measured by synchrotron radiation X-ray fluorescence microprobe. Scanning analysis makes use of excitation of the REE K lines between 33 and 50 keV. SR white beam from a Wiggler source at the Beijing Electron Positron Collider(BEPC) of the National Laboratory, in order to excite the REE. The bastnaesite from the same mineral area was powdered to particle size less than or equal to 300 mesh. It was then divided into two parts. One portion was used to be determined by XRF after depositing with oxalate and transforming into oxide. The other was pressed into disk without any binder as the reference sample. The weight and the diameter of the disk were 15 g and 26 mm respectively. |
学科主题 | Chemistry |
类目[WOS] | Chemistry, Applied |
研究领域[WOS] | Chemistry |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:A1996VZ61700016 |
源URL | [http://ir.ihep.ac.cn/handle/311005/236901] ![]() |
专题 | 高能物理研究所_多学科研究中心 高能物理研究所_粒子天体物理中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | An, QX,Wang, RB,Deng, SW,et al. Scanning analysis of REE in bastnaesite with synchrotron radiation X-ray fluorescence microprobe[J]. JOURNAL OF RARE EARTHS,1996,14(4):308-311. |
APA | An, QX.,Wang, RB.,Deng, SW.,Pan, JX.,Wu, YR.,...&吴应荣.(1996).Scanning analysis of REE in bastnaesite with synchrotron radiation X-ray fluorescence microprobe.JOURNAL OF RARE EARTHS,14(4),308-311. |
MLA | An, QX,et al."Scanning analysis of REE in bastnaesite with synchrotron radiation X-ray fluorescence microprobe".JOURNAL OF RARE EARTHS 14.4(1996):308-311. |
入库方式: OAI收割
来源:高能物理研究所
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