中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs

文献类型:期刊论文

作者Huang, XR; Jiang, SS; Liu, WJ; Wu, XS; Feng, D; Wang, ZG; Han, Y; Wang, JY; Han Y(韩勇)
刊名JOURNAL OF APPLIED CRYSTALLOGRAPHY
出版日期1996
卷号29期号:4页码:371-377
通讯作者CTR ADV STUDIES SCI & TECHNOL MICROSTRUCT,NANJING 210093,PEOPLES R CHINA ; INST HIGH ENERGY PHYS,BSRL,BEIJING 100039,PEOPLES R CHINA ; SHANDONG UNIV,INST CRYSTAL MAT,JINAN 250100,PEOPLES R CHINA
英文摘要White-beam synchrotron topography has been demonstrated to be well suited for observation of all kinds of ferroelastic and ferroelectric twin domains. It is found that the domains that are misorientated against each other always appear as orientation contrasts in the topographs, while the antiparallel domains with parallel lattices may show different diffraction intensity by the synchrotron-radiation anomalous-scattering effect. Based on the reciprocal-lattice splitting and the diffraction geometry, a general method of determination of the image displacement associated with two misoriented domains is given to explain their orientation contrast. It is also revealed that the anomalous-scattering contrast of antiparallel domains arises from the anomalous-dispersion terms of the noncentrosymmetric atoms in the unit cell of ferroelectric crystals.
学科主题Crystallography
类目[WOS]Crystallography
研究领域[WOS]Crystallography
原文出处SCI
语种英语
WOS记录号WOS:A1996VF65000010
源URL[http://ir.ihep.ac.cn/handle/311005/237209]  
专题高能物理研究所_多学科研究中心
高能物理研究所_实验物理中心
高能物理研究所_粒子天体物理中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Huang, XR,Jiang, SS,Liu, WJ,et al. Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,1996,29(4):371-377.
APA Huang, XR.,Jiang, SS.,Liu, WJ.,Wu, XS.,Feng, D.,...&韩勇.(1996).Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs.JOURNAL OF APPLIED CRYSTALLOGRAPHY,29(4),371-377.
MLA Huang, XR,et al."Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs".JOURNAL OF APPLIED CRYSTALLOGRAPHY 29.4(1996):371-377.

入库方式: OAI收割

来源:高能物理研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。