Plane scan analysis of the surface of white and blue porcelain by SRXRF method
文献类型：期刊论文
| 作者 | Yang, YM; Feng, M; Zhu, J; Mao, ZW; Wang, CS; Huang, YY; He, W ; Huang YY(黄宇营); He W(何伟)
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| 刊名 | SPECTROSCOPY AND SPECTRAL ANALYSIS
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| 出版日期 | 2004 |
| 卷号 | 24期号:8页码:902-906 |
| 关键词 | white and blue porcelain SRXRF plane scan analysis non-destructive identification |
| 通讯作者 | Univ Sci & Technol China, Dept Sci & Technol Archaeol, Hefei 230026, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China |
| 英文摘要 | In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements, i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr, into three groups. This phenomenon will indicate how to search the "finger elements" in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze. |
| 学科主题 | Spectroscopy |
| 类目[WOS] | Spectroscopy |
| 研究领域[WOS] | Spectroscopy |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000223843100002 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/238708]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Yang, YM,Feng, M,Zhu, J,et al. Plane scan analysis of the surface of white and blue porcelain by SRXRF method[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS,2004,24(8):902-906. |
| APA | Yang, YM.,Feng, M.,Zhu, J.,Mao, ZW.,Wang, CS.,...&何伟.(2004).Plane scan analysis of the surface of white and blue porcelain by SRXRF method.SPECTROSCOPY AND SPECTRAL ANALYSIS,24(8),902-906. |
| MLA | Yang, YM,et al."Plane scan analysis of the surface of white and blue porcelain by SRXRF method".SPECTROSCOPY AND SPECTRAL ANALYSIS 24.8(2004):902-906. |
入库方式： OAI收割
来源：高能物理研究所
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