High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE
文献类型:期刊论文
作者 | Zhai, ZY; Wu, XS; Jia QJ(贾全杰)![]() ![]() |
刊名 | CHINESE PHYSICS C
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出版日期 | 2009 |
卷号 | 33期号:11页码:949-953 |
关键词 | laser-MBE grazing incident X-ray diffraction reciprocal space mapping |
通讯作者 | [Zhai Zhang-Yin ; Wu Xiao-Shan] Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China ; [Zhai Zhang-Yin ; Wu Xiao-Shan] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China ; [Zhai Zhang-Yin] Huaiyin Normal Univ, Jiangsu Key Lab Chem Low Dimens Mat, Huaian 223300, Peoples R China ; [Zhai Zhang-Yin] Huaiyin Normal Univ, Dept Phys, Huaian 223300, Peoples R China ; [Jia Quan-Jie] CAS, BSRF, Inst High Energy Phys, Beijing 100049, Peoples R China |
英文摘要 | SrTiO3 thin films are epitaxially grown on DyScO3, LaAlO3 substrates with/without buffer layers of DyScO3 and SrRuO3 using laser-MBE. X-ray diffraction methods, such as high resolution X-ray diffraction, grazing incident X-ray diffraction, and reciprocal space mapping are used to investigate the lattice structure., dislocation density, in-plane lattice strain distribution along film thickness. From the measurement results, the effects of substrate on film lattice quality and microstructure are discussed. |
学科主题 | Physics |
类目[WOS] | Physics, Nuclear ; Physics, Particles & Fields |
研究领域[WOS] | Physics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000271893700003 |
源URL | [http://ir.ihep.ac.cn/handle/311005/238790] ![]() |
专题 | 高能物理研究所_多学科研究中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Zhai, ZY,Wu, XS,Jia QJ,et al. High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE[J]. CHINESE PHYSICS C,2009,33(11):949-953. |
APA | Zhai, ZY,Wu, XS,贾全杰,&Jia, QJ.(2009).High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE.CHINESE PHYSICS C,33(11),949-953. |
MLA | Zhai, ZY,et al."High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE".CHINESE PHYSICS C 33.11(2009):949-953. |
入库方式: OAI收割
来源:高能物理研究所
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