New soft X-ray facility SINS for surface and nanoscale science at SSLS
文献类型：期刊论文
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| 作者 | Yu, XJ; Wilhelmi, O; Moser, HO; Vidyaraj, SV; Gao, XY ; Wee, ATS; Nyunt, T; Qian, HJ; Zheng, HW; Qian HJ(钱海杰)
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| 刊名 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
 ; JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
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| 出版日期 | 2005 ; 2005 |
| 卷号 | 144页码:1031-1034 |
| 关键词 | SINS beamline monochromator XMCD photoemission SINS beamline monochromator XMCD photoemission |
| DOI | 10.1016/j.elspec.2005.01.256 |
| 通讯作者 | Natl Univ Singapore, SSLS, Singapore 117603, Singapore ; Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore ; Acad Sinica, Inst High Energy Phys, Beijing 100039, Peoples R China ; Natl Univ Singapore, SSLS, Singapore 117603, Singapore ; Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore ; Acad Sinica, Inst High Energy Phys, Beijing 100039, Peoples R China |
| 文献子类 | Article; Proceedings Paper |
| 英文摘要 | The first soft X-ray facility at the Singapore Synchrotron Light Source was built by FMB and commissioned in 2003. Dubbed SINS for surface, interface, and nanostructure science, it covers a photon energy range from 50 to 1200 eV. The photon beam can be set to left circular, right circular or linear polarization by changing the pitch and vertical position of the vertical focusing mirror of the prefocusing optics. The typical resolution (E/Delta E) and flux are about 1000 at 10(10) photons/s or exceeding 4000 at 10(8) photons/s in a spot of about 1.5 mm x 0.2 nun on the sample. The performance of the beamline was measured using gas photoionization spectra of Ar, He, Kr, and N-2 as well as an XMCD spectrum of a Ni sample. From the Ni XMCD signal, calculation shows that the degree of circular polarization can reach 95% at 850 eV photon energy. The end-station is presently equipped with a hemispherical electron energy analyzer and typical surface science diagnostics including LEED and ion sputtering. Upgrading with an in situ STM/AFM and a growth chamber is underway which will make SINS a unique tool for in situ surface and nanoscale science studies. (c) 2005 Elsevier B.V. All rights reserved.; The first soft X-ray facility at the Singapore Synchrotron Light Source was built by FMB and commissioned in 2003. Dubbed SINS for surface, interface, and nanostructure science, it covers a photon energy range from 50 to 1200 eV. The photon beam can be set to left circular, right circular or linear polarization by changing the pitch and vertical position of the vertical focusing mirror of the prefocusing optics. The typical resolution (E/Delta E) and flux are about 1000 at 10(10) photons/s or exceeding 4000 at 10(8) photons/s in a spot of about 1.5 mm x 0.2 nun on the sample. The performance of the beamline was measured using gas photoionization spectra of Ar, He, Kr, and N-2 as well as an XMCD spectrum of a Ni sample. From the Ni XMCD signal, calculation shows that the degree of circular polarization can reach 95% at 850 eV photon energy. The end-station is presently equipped with a hemispherical electron energy analyzer and typical surface science diagnostics including LEED and ion sputtering. Upgrading with an in situ STM/AFM and a growth chamber is underway which will make SINS a unique tool for in situ surface and nanoscale science studies. (c) 2005 Elsevier B.V. All rights reserved. |
| 学科主题 | Spectroscopy ; Spectroscopy |
| 类目[WOS] | Spectroscopy |
| 研究领域[WOS] | Spectroscopy |
| URL标识 | 查看原文 |
| WOS研究方向 | Spectroscopy |
| 原文出处 | SCI |
| 语种 | 英语 ; 英语 |
| WOS记录号 | WOS:000229657100242 ; WOS:000229657100242 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/238922]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Yu, XJ,Wilhelmi, O,Moser, HO,et al. New soft X-ray facility SINS for surface and nanoscale science at SSLS, New soft X-ray facility SINS for surface and nanoscale science at SSLS[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,2005, 2005,144, 144:1031-1034, 1031-1034. |
| APA | Yu, XJ.,Wilhelmi, O.,Moser, HO.,Vidyaraj, SV.,Gao, XY.,...&郑红卫.(2005).New soft X-ray facility SINS for surface and nanoscale science at SSLS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,144,1031-1034. |
| MLA | Yu, XJ,et al."New soft X-ray facility SINS for surface and nanoscale science at SSLS".JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 144(2005):1031-1034. |
入库方式： OAI收割
来源：高能物理研究所
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