中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A high accuracy image sensor for sinusoidal phase-modulating interferometry

文献类型:期刊论文

作者Guotian He ; Dailin Li ; Wang XC(王向朝) ; Jianmin Hu
刊名optik
出版日期2008
卷号119期号:7页码:315
关键词image sensor synchronization technology sampling error CCD sinusoidal phase modulating
ISSN号0030-4026
中文摘要we proposed a high accuracy image sensor technique for sinusoidal phase-modulating interferometer in the field of the surface profile measurements. it solved the problem of the ccd's pixel offset of the same column under two adjacent rows, eliminated the spectral leakage, and reduced the influence of external interference to the measurement accuracy. we measured the surface profile of a glass plate, and its repeatability precision was less than 8 nm and its relative error was 1.15 %. the results show that it can be used to measure surface profile with high accuracy and strong anti-interference ability. (c) 2007 elsevier gmbh. all rights reserved.
收录类别EI
语种英语
公开日期2009-09-18
源URL[http://ir.siom.ac.cn/handle/181231/2298]  
专题上海光学精密机械研究所_信息光学开放实验室
推荐引用方式
GB/T 7714
Guotian He,Dailin Li,Wang XC,et al. A high accuracy image sensor for sinusoidal phase-modulating interferometry[J]. optik,2008,119(7):315, 320.
APA Guotian He,Dailin Li,王向朝,&Jianmin Hu.(2008).A high accuracy image sensor for sinusoidal phase-modulating interferometry.optik,119(7),315.
MLA Guotian He,et al."A high accuracy image sensor for sinusoidal phase-modulating interferometry".optik 119.7(2008):315.

入库方式: OAI收割

来源:上海光学精密机械研究所

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