Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs
文献类型：期刊论文
| 作者 | Li, ZH ; Gong, YJ; Wu, D; Sun, YH; Wang, J; Liu, Y; Dong, BZ; Wang J(王俊); Liu Y(柳义); Dong BZ(董宝中)
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| 刊名 | ACTA PHYSICA SINICA
 |
| 出版日期 | 2001 |
| 卷号 | 50期号:6页码:1128-1131 |
| 关键词 | small angle X-ray scattering sols the average thickness of interface layer |
| 通讯作者 | Chinese Acad Sci, State Key Lab Coal Convers, Inst Coal Chem, Taiyuan 030001, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Lab Synchrotron Radiat, Beijing 100039, Peoples R China |
| 英文摘要 | The average thickness of the interface layer wrapped about sols usually is determined by fitting the Pored curve that shows a negative deviation from Pored's law. In this paper we show that it could also be determined by a new method that includes the following steps:(1) determining the average radius R-1 of the sol particles including interface layer from the small angle X-ray scattering data in which shows negative deviation from Pored's law;(2) determining the average radius R-2 of the sol particles not including the interface layer from the scattering data in which has been corrected the negative deviation from Pored's law;(3) the difference DeltaR between R-1 and R-2, i.e. DeltaR = R-1 - R-2 , is just the average thickness of the interface layer wrapped about sols. By using the above method,the average thickness of the interface layer wrapped about SiO2 sols prepared under different conditions were determined. |
| 学科主题 | Physics |
| 类目[WOS] | Physics, Multidisciplinary |
| 研究领域[WOS] | Physics |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000169036700024 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/239090]  |
| 专题 | 高能物理研究所_多学科研究中心 高能物理研究所_加速器中心 高能物理研究所_粒子天体物理中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Li, ZH,Gong, YJ,Wu, D,et al. Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs[J]. ACTA PHYSICA SINICA,2001,50(6):1128-1131. |
| APA | Li, ZH.,Gong, YJ.,Wu, D.,Sun, YH.,Wang, J.,...&董宝中.(2001).Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs.ACTA PHYSICA SINICA,50(6),1128-1131. |
| MLA | Li, ZH,et al."Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs".ACTA PHYSICA SINICA 50.6(2001):1128-1131. |
入库方式： OAI收割
来源：高能物理研究所
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