Sulfidation growth and characterization of nanocrystalline ZnS thin films
文献类型：期刊论文
| 作者 | Zhang, RG; Wang BY(王宝义) ; Wei L(魏龙); Wang, BY; Wei, L
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| 刊名 | VACUUM
 |
| 出版日期 | 2008 |
| 卷号 | 82期号:11页码:1208-1211 |
| 关键词 | ZnS thin film ZnO thin film reactive magnetron sputtering sulfidation |
| 通讯作者 | [Zhang, Rengang] Wuhan Univ Sci & Technol, Dept Appl Phys, Wuhan 430081, Peoples R China ; [Wang, Baoyi ; Wei, Long] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China |
| 英文摘要 | Nanocrystalline ZnS thin films are prepared on glass and quartz substrates by sulfurizing ZnO thin films in the H2S-containing mixture at 500 degrees C. These films are investigated by X-ray diffraction, scanning electron morphology, optical transmittance and photoluminescence spectra. The results show that the ZnS thin films have the hexagonal structure with a c-axis preferred orientation. Also, these nanostructure ZnS thin films with the grain size of similar to 50 nm along the c-axis, exhibit the optical transparency as high as similar to 80% in the visible region. It is found that sulfur replacement of oxygen sites in crystal lattices and recrystallization can take place during sulfidation, resulting in an evident increase of the grain size for the sulfurized films. Under the optimum sulfidation time of 2 h, the resultant ZnS thin films have a high crystallinity, low defect concentration and good optical properties with the band gap of 3.66 eV. (C) 2008 Elsevier Ltd. All rights reserved. |
| 学科主题 | Materials Science; Physics |
| 类目[WOS] | Materials Science, Multidisciplinary ; Physics, Applied |
| 研究领域[WOS] | Materials Science ; Physics |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000257632400013 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/239183]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Zhang, RG,Wang BY,Wei L,et al. Sulfidation growth and characterization of nanocrystalline ZnS thin films[J]. VACUUM,2008,82(11):1208-1211. |
| APA | Zhang, RG,王宝义,魏龙,Wang, BY,&Wei, L.(2008).Sulfidation growth and characterization of nanocrystalline ZnS thin films.VACUUM,82(11),1208-1211. |
| MLA | Zhang, RG,et al."Sulfidation growth and characterization of nanocrystalline ZnS thin films".VACUUM 82.11(2008):1208-1211. |
入库方式： OAI收割
来源：高能物理研究所
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