Determination of average pore diameter of SiO2 xerogels by small angle X-ray scattering
文献类型：期刊论文
| 作者 | Li, ZH ; Sun, JH; Wu, D; Sun, YH; Liu, Y; Sheng, WJ; Dong, BZ; Liu Y(柳义); Sheng WJ(生文君); Dong BZ(董宝中)
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| 刊名 | ACTA PHYSICA SINICA
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| 出版日期 | 2000 |
| 卷号 | 49期号:7页码:1312-1315 |
| 关键词 | small angle X-ray scattering SiO2 xerogels average pore diameter |
| 通讯作者 | Chinese Acad Sci, Inst Coal Chem, State Key Lab Coal Convers, Taiyuan 030001, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China |
| 英文摘要 | Small angle X-ray scattering (SAXS) with synchrotron radiation as X-ray source has been used to study the structure of Sig xerogels prepared by sol-gel process. All SAXS profiles in this paper deviate from Porod's law and show negative or positive deviation. In order to obtain the information of pore in SiO2 xerogels, we have proposed the corresponding methods to correct the negative and positive deviations from Pored's law. Then, the average pore diameter of SiO2 xerogels is determined with Debye's method and Guinier's method, separately, and the results are found to be close to each other. The average diameters fall in the rang1 3-25 nm for samples prepared under various conditions. The results of SAXS are also close to that determined by N-2 adsorption method at 77 K with ASAP2000. |
| 学科主题 | Physics |
| 类目[WOS] | Physics, Multidisciplinary |
| 研究领域[WOS] | Physics |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000088125500020 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/239271]  |
| 专题 | 高能物理研究所_多学科研究中心 高能物理研究所_加速器中心 高能物理研究所_粒子天体物理中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Li, ZH,Sun, JH,Wu, D,et al. Determination of average pore diameter of SiO2 xerogels by small angle X-ray scattering[J]. ACTA PHYSICA SINICA,2000,49(7):1312-1315. |
| APA | Li, ZH.,Sun, JH.,Wu, D.,Sun, YH.,Liu, Y.,...&董宝中.(2000).Determination of average pore diameter of SiO2 xerogels by small angle X-ray scattering.ACTA PHYSICA SINICA,49(7),1312-1315. |
| MLA | Li, ZH,et al."Determination of average pore diameter of SiO2 xerogels by small angle X-ray scattering".ACTA PHYSICA SINICA 49.7(2000):1312-1315. |
入库方式： OAI收割
来源：高能物理研究所
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