High-energy resolution mu-XRF analysis by position sensitive spectrometer
文献类型:期刊论文
作者 | Hu CH(胡朝晖); Liu SJ(刘世杰); Liu PS(刘平生); Feng GH(冯国华); Han Y(韩勇)![]() ![]() ![]() |
刊名 | CHINESE SCIENCE BULLETIN
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出版日期 | 2000 |
卷号 | 45期号:21页码:1934-1938 |
关键词 | position sensitive spectrometer (PSS) high-energy resolution X-ray focusing lens mu-XRF |
通讯作者 | Chinese Acad Sci, Inst High Energy Phys, Lab Nucl Anal, Beijing 100080, Peoples R China |
英文摘要 | With a high-energy resolution micro-X-ray fluorescence (mu -XRF) analysis setup, which basically consists of an X-ray microbeam formed by an X-ray focusing lens combined with an X-ray apparatus and a wavelength dispersive position sensitive spectrometer with a flat crystal (PSS), preliminary results have been obtained. The counting rate of the analyzed element linearly increased with the power of X-ray apparatus, and the energy resolution, full width of half maximum (FWHM) of K alpha lines of Ti and Cr reached 16.6 and 23.6 eV, respectively. The Cr K beta and Mn K alpha lines in a sample of stainless steel could clearly be resolved. The above-mentioned results are also compared with those obtained by synchrotron radiation light microbeam combined with the PSS. The facts show that the high-energy resolution element analysis is feasible by using the setup. Moreover, problems for the setup and the ways to resolve them are discussed as well. |
学科主题 | Science & Technology - Other Topics |
类目[WOS] | Multidisciplinary Sciences |
研究领域[WOS] | Science & Technology - Other Topics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000165415400003 |
源URL | [http://ir.ihep.ac.cn/handle/311005/239586] ![]() |
专题 | 高能物理研究所_多学科研究中心 中国科学院高能物理研究所_中国散裂中子源 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Hu CH,Liu SJ,Liu PS,et al. High-energy resolution mu-XRF analysis by position sensitive spectrometer[J]. CHINESE SCIENCE BULLETIN,2000,45(21):1934-1938. |
APA | 胡朝晖.,刘世杰.,刘平生.,冯国华.,韩勇.,...&Han, Y.(2000).High-energy resolution mu-XRF analysis by position sensitive spectrometer.CHINESE SCIENCE BULLETIN,45(21),1934-1938. |
MLA | 胡朝晖,et al."High-energy resolution mu-XRF analysis by position sensitive spectrometer".CHINESE SCIENCE BULLETIN 45.21(2000):1934-1938. |
入库方式: OAI收割
来源:高能物理研究所
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