NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE
文献类型：期刊论文
| 作者 | WHITFIELD, SB; CALDWELL, CD; HUANG, DX; KRAUSE, MO; Huang DX(黄达贤) |
| 刊名 | JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
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| 出版日期 | 1992 |
| 卷号 | 25期号:22页码:4755-4771 |
| 通讯作者 | BEIJING SYNCHROTRON RADIAT LAB,INST HIGH ENERGY PHYS,BEIJING 100039,PEOPLES R CHINA ; OAK RIDGE NATL LAB,DIV CHEM,OAK RIDGE,TN 37831 |
| 英文摘要 | The angular distribution parameter beta of the N5-O2,3O2,3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter alpha2 for each of the N5-O2,3O2,3 Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of beta and alpha2 for the N5-O2,3O2,3 Auger lines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff. |
| 学科主题 | Optics; Physics |
| 类目[WOS] | Optics ; Physics, Atomic, Molecular & Chemical |
| 研究领域[WOS] | Optics ; Physics |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:A1992KA75000012 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/239997]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | WHITFIELD, SB,CALDWELL, CD,HUANG, DX,et al. NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE[J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,1992,25(22):4755-4771. |
| APA | WHITFIELD, SB,CALDWELL, CD,HUANG, DX,KRAUSE, MO,&黄达贤.(1992).NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,25(22),4755-4771. |
| MLA | WHITFIELD, SB,et al."NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE".JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS 25.22(1992):4755-4771. |
入库方式： OAI收割
来源：高能物理研究所
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