Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering
文献类型：期刊论文
| 作者 | Chen, HJ; Li, SY ; Liu, XJ; Li, RP; Smilgies, DM; Wu, ZH; Li, ZH; Wu ZH(吴忠华); Li ZH(李志宏)
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| 刊名 | JOURNAL OF PHYSICAL CHEMISTRY B
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| 出版日期 | 2009 |
| 卷号 | 113期号:38页码:12623-12627 |
| 通讯作者 | [Chen, Hong-Ji ; Li, Sheng-Ying ; Liu, Xiao-Jun] Jinan Univ, Dept Mat Sci & Engn, Guangzhou 510632, Guangdong, Peoples R China ; [Li, Rui-Peng ; Smilgies, Detlef-M.] Cornell Univ, Cornell High Energy Synchrotron Source, Ithaca, NY 14853 USA ; [Li, Rui-Peng ; Smilgies, Detlef-M.] Corning Inc, SP FR 6, Corning, NY 14830 USA ; [Wu, Zhong-Hua ; Li, Zhihong] Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China |
| 英文摘要 | Nanoporous thin films fabricated by both a core-shell-shaped organic-inorganic hybrid sphere (octa(2,4-dinitrophenyl)silsesquioxane, ODNPSQ) and a four-leg-numbered surfactant (polyoxyethylene sorbitan monolaurate, Tween-20) for porogens in a higher molecular weight precursor (polyphenylsilsesquioxane, PPSQ) were characterized, respectively, by grazing incidence small-angle X-ray scattering (GISAXS), and the measured 2D GISAXS profiles were analyzed quantitatively by using a GISAXS formula based on the distorted wave Born approximation (DWBA). The fitted 2D GISAXS data show that the PPSQ porous thin films imprinted with ODNPSQ porogen exhibit sphere-shaped closed pores with the average pore size within a range of 1.18-3.12 nm and pore size distribution widths about 3.0 nm when the porogen loadings increase from 10 to 40 wt % and those imprinted with Tween-20 porogen give out an average pore size of 1.07-1.29 nm and pore size distribution widths about 2.0 nm with the porogen loading varying from 5 to 30 wt %. The nanoporous dielectric thin films imprinted with ODNPSQ porogen show a reducing to the molecular aggregation of porogens and significant antiphase separation behavior in the cross-linked matrix. |
| 学科主题 | Chemistry |
| 类目[WOS] | Chemistry, Physical |
| 研究领域[WOS] | Chemistry |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000269747300001 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/240189]  |
| 专题 | 高能物理研究所_多学科研究中心 高能物理研究所_粒子天体物理中心 高能物理研究所_理论物理室 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Chen, HJ,Li, SY,Liu, XJ,et al. Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering[J]. JOURNAL OF PHYSICAL CHEMISTRY B,2009,113(38):12623-12627. |
| APA | Chen, HJ.,Li, SY.,Liu, XJ.,Li, RP.,Smilgies, DM.,...&李志宏.(2009).Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering.JOURNAL OF PHYSICAL CHEMISTRY B,113(38),12623-12627. |
| MLA | Chen, HJ,et al."Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering".JOURNAL OF PHYSICAL CHEMISTRY B 113.38(2009):12623-12627. |
入库方式： OAI收割
来源：高能物理研究所
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