Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers
文献类型:期刊论文
作者 | Wang J(王俊); Wang, J; Park, YJ; Lee, KB; Hong, H; Davidov, D |
刊名 | PHYSICAL REVIEW B
![]() |
出版日期 | 2002 |
卷号 | 66期号:16页码:161201 |
通讯作者 | Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China ; Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea ; Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, South Korea ; Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel |
英文摘要 | The interfacial structures of self-assembled heterostructures through alternate deposition of conjugated and nonconjugated polymers were studied by x-ray reflectivity and nonspecular scattering. We found that the interfacial width including the effects of both interdiffusion and interfacial roughness (correlated) was mainly contributed by the latter one. The self-assembled deposition induced very small interdiffusion between layers. The lateral correlation length xi(parallel to) grew as a function of deposition time (or film thickness) described by a power law xi(parallel to)proportional tot(beta/H) and was also observed from the off-specular scattering. |
学科主题 | Physics |
类目[WOS] | Physics, Condensed Matter |
研究领域[WOS] | Physics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000179286400005 |
源URL | [http://ir.ihep.ac.cn/handle/311005/241009] ![]() |
专题 | 高能物理研究所_多学科研究中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Wang J,Wang, J,Park, YJ,et al. Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers[J]. PHYSICAL REVIEW B,2002,66(16):161201. |
APA | 王俊,Wang, J,Park, YJ,Lee, KB,Hong, H,&Davidov, D.(2002).Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers.PHYSICAL REVIEW B,66(16),161201. |
MLA | 王俊,et al."Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers".PHYSICAL REVIEW B 66.16(2002):161201. |
入库方式: OAI收割
来源:高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。