中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy

文献类型:期刊论文

作者Song, HP; Yang, AL; Wei, HY; Guo, Y; Zhang, B; Zheng, GL; Yang, SY; Liu, XL; Zhu, QS; Wang, ZG
刊名APPLIED PHYSICS LETTERS
出版日期2009
卷号94期号:22页码:222114
关键词conduction bands III-V semiconductors indium compounds semiconductor heterojunctions semiconductor materials valence bands X-ray photoelectron spectra
通讯作者[Song, H. P. ; Yang, A. L. ; Wei, H. Y. ; Guo, Y. ; Zhang, B. ; Zheng, G. L. ; Yang, S. Y. ; Liu, X. L. ; Zhu, Q. S. ; Wang, Z. G.] Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China ; [Yang, T. Y. ; Wang, H. H.] Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China
英文摘要In2O3 is a promising partner of InN to form InN/In2O3 heterosystems. The valence band offset (VBO) of wurtzite InN/cubic In2O3 heterojunction is determined by x-ray photoemission spectroscopy. The valence band of In2O3 is found to be 1.47 +/- 0.11 eV below that of InN, and a type-I heterojunction with a conduction band offset (CBO) of 0.49-0.99 eV is found. The accurate determination of the VBO and CBO is important for use of InN/In2O3 based electronic devices.
学科主题Physics
类目[WOS]Physics, Applied
研究领域[WOS]Physics
原文出处SCI
语种英语
WOS记录号WOS:000266674300037
源URL[http://ir.ihep.ac.cn/handle/311005/241036]  
专题高能物理研究所_多学科研究中心
高能物理研究所_实验物理中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Song, HP,Yang, AL,Wei, HY,et al. Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy[J]. APPLIED PHYSICS LETTERS,2009,94(22):222114.
APA Song, HP.,Yang, AL.,Wei, HY.,Guo, Y.,Zhang, B.,...&王焕华.(2009).Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy.APPLIED PHYSICS LETTERS,94(22),222114.
MLA Song, HP,et al."Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy".APPLIED PHYSICS LETTERS 94.22(2009):222114.

入库方式: OAI收割

来源:高能物理研究所

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