Accuracy analysis of parallel plate interferometer for angular displacement measurement
文献类型：期刊论文
| 作者 | Zheng DF(郑德锋) ; Wang XC(王向朝) ; Li Zhongliang |
| 刊名 | opt. laser technol.
 |
| 出版日期 | 2008 |
| 卷号 | 40期号:1页码:6 |
| 关键词 | accuracy analysis interferometer plane-parallel plate |
| ISSN号 | 0030-3992 |
| 中文摘要 | the measurement accuracy of a parallel-plate interferometer for angular displacement measurement is analyzed. the measurement accuracy of angular displacement is not only related to the accuracy of phase extraction, but also related to initial incident angle, refraction index and thickness of plane-parallel plate as well as wavelength's stability of laser diode, etc. theoretical analysis and computer simulation show that the measurement error of the angular displacement bears a minimum value when choosing an optimal initial incident angle in a large range. these analytical results serve as a guide in practical measurement. in this interferometer, reducing the refraction index or increasing the thickness of the parallel plate can improve the measurement accuracy; and the relative error of the phase measurement is 3.0 x 10(-4) corresponding to 1 degrees c temperature variation. based on these theoretical and experimental results, the measurement accuracy of the parallel-plate interferometer is up to an order of 10(-8) rad. (c) 2007 elsevier ltd. all rights reserved. |
| 收录类别 | EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000250258800002 |
| 公开日期 | 2009-09-18 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/2340]  |
| 专题 | 上海光学精密机械研究所_信息光学开放实验室 |
| 推荐引用方式 GB/T 7714 | Zheng DF,Wang XC,Li Zhongliang. Accuracy analysis of parallel plate interferometer for angular displacement measurement[J]. opt. laser technol.,2008,40(1):6, 12. |
| APA | 郑德锋,王向朝,&Li Zhongliang.(2008).Accuracy analysis of parallel plate interferometer for angular displacement measurement.opt. laser technol.,40(1),6. |
| MLA | 郑德锋,et al."Accuracy analysis of parallel plate interferometer for angular displacement measurement".opt. laser technol. 40.1(2008):6. |
入库方式： OAI收割
来源：上海光学精密机械研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。