中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Submicroradian laser beam angular scan precision measurement by interference method

文献类型:期刊论文

作者Jianfeng Sun ; Liren Liu ; Anhu Li ; and Deyan Xu ; Submicroradian laser beam angular scan precision measurement by interference method
刊名optical engineering
出版日期2009
卷号48期号:7
合作状况其它
学科主题光学 ; 光测量
收录类别其他
语种中文
WOS记录号WOS:000268489400011
公开日期2010-04-21
源URL[http://ir.siom.ac.cn/handle/181231/6424]  
专题上海光学精密机械研究所_信息光学开放实验室
推荐引用方式
GB/T 7714
Jianfeng Sun,Liren Liu,Anhu Li,et al. Submicroradian laser beam angular scan precision measurement by interference method[J]. optical engineering,2009,48(7).
APA Jianfeng Sun,Liren Liu,Anhu Li,and Deyan Xu,&Submicroradian laser beam angular scan precision measurement by interference method.(2009).Submicroradian laser beam angular scan precision measurement by interference method.optical engineering,48(7).
MLA Jianfeng Sun,et al."Submicroradian laser beam angular scan precision measurement by interference method".optical engineering 48.7(2009).

入库方式: OAI收割

来源:上海光学精密机械研究所

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