Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis
文献类型：期刊论文
| 作者 | Kang, SX; Sun, X ; Ju X(巨新); Huang YY(黄宇营); Xian DC(冼鼎昌); Ju, X; Huang, YY; Yao, K; Wu, ZQ; Xian, DC
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| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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| 出版日期 | 2002 |
| 卷号 | 192期号:4页码:365-369 |
| 关键词 | synchrotron radiation X-ray fluorescence analysis Si(Li) detector escape peak |
| 通讯作者 | Univ Sci & Technol, Dept Astron & Appl Phys, Hefei 230036, Anhui, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China |
| 英文摘要 | In synchrotron radiation X-ray fluorescence experiments, the escape peaks, generating from the Si(Li) solid detector, can disrupt seriously the quantitative and qualitative analysis. In this paper, 14 specimens, such as metals, compounds and plants, have been chosen as objectives to determine the intensities and positions of escape peaks. In all, the characteristic X-ray fluorescence peaks and their escape peaks of 12 elements have been measured. Comparing the experimental values with the standard values, the escape peaks can be discriminated. To calculate the ratios of intensities of the escape peaks and their corresponding characteristic X-ray fluorescence peaks, a simplified Si Kalpha emergent spherical distribution has been put forward. It is found that the experimental results are in accordance with that of calculation, i.e. both the experimental and theoretical ratios decrease from 1% to 0.1% with the increasing atomic number from 18 to 33 (from 1 to 9 keV in X-ray range). (C) 2002 Elsevier Science B.V. All rights reserved. |
| 学科主题 | Instruments & Instrumentation; Nuclear Science & Technology; Physics |
| 类目[WOS] | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear |
| 研究领域[WOS] | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| 原文出处 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000176521100003 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/237180]  |
| 专题 | 高能物理研究所_院士 中国科学院高能物理研究所 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Kang, SX,Sun, X,Ju X,et al. Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2002,192(4):365-369. |
| APA | Kang, SX.,Sun, X.,巨新.,黄宇营.,冼鼎昌.,...&Xian, DC.(2002).Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,192(4),365-369. |
| MLA | Kang, SX,et al."Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 192.4(2002):365-369. |
入库方式： OAI收割
来源：高能物理研究所
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