中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Method of Removing Reflected Highlight on Images Based on Polarimetric Imaging

文献类型:期刊论文

作者Yang, Fanchao1,2; Tang, Xingjia1; Hu, Bingliang1; Wei, Ruyi1; Kong, Liang1; Li, Yong1
刊名journal of sensors
出版日期2016
ISSN号1687-725x
产权排序1
英文摘要a method of removing reflected highlight is proposed on polarimetric imaging. polarization images (0 degrees, 45 degrees, 90 degrees, and 135 degrees) and the reflection angle are required in this reflected light removal algorithm. this method is based on the physical model of reflection and refraction, and no additional image processing algorithm is necessary in this algorithm. compared to traditional polarization method with single polarizer, restricted observation angle of brewster is not demanded and multiple reflection areas of different polarization orientations can be removed simultaneously. experimental results, respectively, demonstrate the features of this reflected light removal algorithm, and it can be considered very suitable in polarization remote sensing.
WOS标题词science & technology ; technology
类目[WOS]engineering, electrical & electronic ; instruments & instrumentation
研究领域[WOS]engineering ; instruments & instrumentation
收录类别SCI ; EI
语种英语
WOS记录号WOS:000375596300001
源URL[http://ir.opt.ac.cn/handle/181661/28122]  
专题西安光学精密机械研究所_光学影像学习与分析中心
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Key Lab Spectral Imaging Technol, Xian 710119, Peoples R China
2.Univ Chinese Acad Sci, Beijing 10049, Peoples R China
推荐引用方式
GB/T 7714
Yang, Fanchao,Tang, Xingjia,Hu, Bingliang,et al. A Method of Removing Reflected Highlight on Images Based on Polarimetric Imaging[J]. journal of sensors,2016.
APA Yang, Fanchao,Tang, Xingjia,Hu, Bingliang,Wei, Ruyi,Kong, Liang,&Li, Yong.(2016).A Method of Removing Reflected Highlight on Images Based on Polarimetric Imaging.journal of sensors.
MLA Yang, Fanchao,et al."A Method of Removing Reflected Highlight on Images Based on Polarimetric Imaging".journal of sensors (2016).

入库方式: OAI收割

来源:西安光学精密机械研究所

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