Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters
文献类型：期刊论文
| 作者 | Shen, Zhihua1; Wang, Xiao1; Wu, Shengli1; Tian, JinShou2
|
| 刊名 | journal of micromechanics and microengineering
 |
| 出版日期 | 2016-04-01 |
| 卷号 | 26期号:4 |
| 关键词 | finite integration technique (FIT) nanometer-scale fissure surface-conduction electron emitter |
| ISSN号 | 0960-1317 |
| 产权排序 | 2 |
| 英文摘要 | a simulation model was built to numerically investigate the electron emission property of a new surface-conduction electron emitter (sce) with a raised emitter structure. the model calculated the electric field distribution, the electron emission characteristics, and the electron trajectories, which were useful for analyzing and understanding the microscopic mechanism of the electron emissions of the new sce structure. it was found that the new structure increased the probability of electrons being collected by the anode which led to an increase of the anode current despite of the decrease of field emission current. this study benefits the advanced design of emitter structures in nanoscale technology for new types of electron sources. |
| WOS标题词 | science & technology ; technology |
| 类目[WOS] | engineering, electrical & electronic ; nanoscience & nanotechnology ; instruments & instrumentation ; materials science, multidisciplinary ; mechanics |
| 研究领域[WOS] | engineering ; science & technology - other topics ; instruments & instrumentation ; materials science ; mechanics |
| 关键词[WOS] | field-emission characteristics ; x-ray source ; work function ; efficiency |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000375230900011 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/28123]  |
| 专题 | 条纹相机工程中心 |
| 作者单位 | 1.Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Peoples R China 2.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China |
| 推荐引用方式 GB/T 7714 | Shen, Zhihua,Wang, Xiao,Wu, Shengli,et al. Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters[J]. journal of micromechanics and microengineering,2016,26(4). |
| APA | Shen, Zhihua,Wang, Xiao,Wu, Shengli,&Tian, JinShou.(2016).Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters.journal of micromechanics and microengineering,26(4). |
| MLA | Shen, Zhihua,et al."Analysis of the influence of nanofissure morphology on the performance of surface-conduction electron emitters".journal of micromechanics and microengineering 26.4(2016). |
入库方式： OAI收割
来源：西安光学精密机械研究所
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