CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE
文献类型：期刊论文
| 作者 | Su, Weitao ; Dou, Honglei ; Huo, Dexuan ; Yu, Guolin ; Dai, Ning |
| 刊名 | SURFACE REVIEW AND LETTERS
 |
| 出版日期 | 2016 |
| 卷号 | 23期号:1 |
| ISSN号 | 0218-625X |
| 公开日期 | 2016-09-18 |
| 源URL | [http://ir.nimte.ac.cn/handle/174433/13112]  |
| 专题 | 宁波材料技术与工程研究所_2016专题 |
| 推荐引用方式 GB/T 7714 | Su, Weitao,Dou, Honglei,Huo, Dexuan,et al. CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE[J]. SURFACE REVIEW AND LETTERS,2016,23(1). |
| APA | Su, Weitao,Dou, Honglei,Huo, Dexuan,Yu, Guolin,&Dai, Ning.(2016).CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE.SURFACE REVIEW AND LETTERS,23(1). |
| MLA | Su, Weitao,et al."CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE".SURFACE REVIEW AND LETTERS 23.1(2016). |
入库方式： OAI收割
来源：宁波材料技术与工程研究所
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