Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy
文献类型：期刊论文
| 作者 | Su, Weitao ; Kumar, Naresh ; Dai, Ning ; Roy, Debdulal |
| 刊名 | CHEMICAL COMMUNICATIONS
 |
| 出版日期 | 2016 |
| 卷号 | 52期号:53页码:8227-8230 |
| ISSN号 | 1359-7345 |
| 公开日期 | 2016-09-18 |
| 源URL | [http://ir.nimte.ac.cn/handle/174433/13167]  |
| 专题 | 宁波材料技术与工程研究所_2016专题 |
| 推荐引用方式 GB/T 7714 | Su, Weitao,Kumar, Naresh,Dai, Ning,et al. Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy[J]. CHEMICAL COMMUNICATIONS,2016,52(53):8227-8230. |
| APA | Su, Weitao,Kumar, Naresh,Dai, Ning,&Roy, Debdulal.(2016).Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy.CHEMICAL COMMUNICATIONS,52(53),8227-8230. |
| MLA | Su, Weitao,et al."Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy".CHEMICAL COMMUNICATIONS 52.53(2016):8227-8230. |
入库方式： OAI收割
来源：宁波材料技术与工程研究所
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