中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns

文献类型:期刊论文

作者Zeng Xiahui ; Wu Fengtie
刊名opt. eng.
出版日期2008
卷号47期号:8页码:83401
ISSN号0091-3286
关键词diffraction-free beam pattern Bessel beam elliptical manufacture error axicon spot array
中文摘要based on the generalized huygens-fresnel diffraction integral theory and the stationary-phase method, we analyze the influence on diffraction-free beam patterns of an elliptical manufacture error in an axicon. the numerical simulation is compared with the beam patterns photographed by using a ccd camera. theoretical simulation and experimental results indicate that the intensity of the central spot decreases with increasing elliptical manufacture defect and propagation distance. meanwhile, the bright rings around the central spot are gradually split into four or more symmetrical bright spots. the experimental results fit the theoretical simulation very well. (c) 2008 society of photo-optical instrumentation engineers.
资助信息national natural science foundation of china [60477041]; fujian provincial natural science foundation of china [a0410017, a0710011]
语种英语
WOS记录号WOS:000259865500003
公开日期2009-09-18
源URL[http://ir.siom.ac.cn/handle/181231/3274]  
专题上海光学精密机械研究所_高功率激光物理国家实验室
推荐引用方式
GB/T 7714
Zeng Xiahui,Wu Fengtie. Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns[J]. opt. eng.,2008,47(8):83401.
APA Zeng Xiahui,&Wu Fengtie.(2008).Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns.opt. eng.,47(8),83401.
MLA Zeng Xiahui,et al."Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns".opt. eng. 47.8(2008):83401.

入库方式: OAI收割

来源:上海光学精密机械研究所

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