Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode
文献类型：会议论文
| 作者 | Nie, Zhiqiang1 ; Wu, Di2; Lu, Yao1; Wu, Dhai1; Wang, Shuna1; Zhang, Pu1; Xiong, Lingling1; Li, Xiaoning2; Shen, Zenan2
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| 出版日期 | 2016-10-04 |
| 会议名称 | 17th international conference on electronic packaging technology, icept 2016 |
| 会议日期 | 2016-08-16 |
| 会议地点 | wuhan, china |
| 关键词 | Chip scale packages Defects Degradation Electronics packaging High power lasers Laser beam welding Power semiconductor diodes Reliability Reliability analysis Semiconductor diodes |
| 页码 | 111-115 |
| 英文摘要 | the reliability is the important performance of high power semiconductor laser. thermally accelerated ageing test is an important technology of lifetime evaluation and reliability analysis. in this study, three groups of thermally accelerated ageing tests of conduction;cooled;packaged 60w 808nm high power diode laser arrays packaged by indium solder at constant current have been carried out. analysis of ageing data suggest the extrapolated lifetime under room temperature to value device reliability. we also analyze and discuss the degradation modes. this work can provide guidance for optimizing the chip and package structure, is helpful for improving performance and enhancing reliability of high power semiconductor lasers. © 2016 ieee. |
| 收录类别 | EI ; ISTP |
| 产权排序 | 1 |
| 会议录 | 2016 17th international conference on electronic packaging technology, icept 2016
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| 会议录出版者 | institute of electrical and electronics engineers inc. |
| 学科主题 | semiconductor devices and integrated circuits ; lasers ; chemical reactions ; materials science |
| 语种 | 英语 |
| ISBN号 | 9781509013968 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/28421]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 西安光学精密机械研究所_炬光科技有限公司 |
| 作者单位 | 1.State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Shaanxi, China 2.Focuslight Technologies Co. LTD, Xi'an, Shaanxi, China |
| 推荐引用方式 GB/T 7714 | Nie, Zhiqiang,Wu, Di,Lu, Yao,et al. Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode[C]. 见:17th international conference on electronic packaging technology, icept 2016. wuhan, china. 2016-08-16. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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