Accurate determination of electronic transport properties of semiconductor wafers with spatially resolved photo-carrier techniques
文献类型：期刊论文
| 作者 | Li Bincheng; Liu Xianming; Li Wei; Huang Qiuping; Zhang Xiren |
| 刊名 | Journal of Physics: Conference Series
 |
| 出版日期 | 2010 |
| 卷号 | 214 |
| 通讯作者 | Li Bincheng |
| 语种 | 英语 |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/6574]  |
| 专题 | 光电技术研究所_薄膜光学技术研究室（十一室） |
| 作者单位 | 中国科学院光电技术研究所 |
| 推荐引用方式 GB/T 7714 | Li Bincheng,Liu Xianming,Li Wei,et al. Accurate determination of electronic transport properties of semiconductor wafers with spatially resolved photo-carrier techniques[J]. Journal of Physics: Conference Series,2010,214. |
| APA | Li Bincheng,Liu Xianming,Li Wei,Huang Qiuping,&Zhang Xiren.(2010).Accurate determination of electronic transport properties of semiconductor wafers with spatially resolved photo-carrier techniques.Journal of Physics: Conference Series,214. |
| MLA | Li Bincheng,et al."Accurate determination of electronic transport properties of semiconductor wafers with spatially resolved photo-carrier techniques".Journal of Physics: Conference Series 214(2010). |
入库方式： OAI收割
来源：光电技术研究所
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