Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique
文献类型:期刊论文
作者 | Hao, Honggang1; Rao, Min1; Zhou, Ao1; Yin, Bo1; Li, Bincheng2 |
刊名 | Optik
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出版日期 | 2013 |
卷号 | 124期号:3页码:250-254 |
ISSN号 | 00304026 |
通讯作者 | Hao, H. (haohg@cqupt.edu.cn) |
中文摘要 | The photothermal detuning technique (PTDT) is a novel photothermal technique and can be used to measure the absorption of the optical coatings, which utilizes the spectral shift of optical coatings caused by absorption-induced temperature rise. The measurement sensitivity depends on the slope of the spectrum band edge and the character of the probe beam, and is limited by the temperature coefficient of the reflectivity or transmission. Based on the preliminary study, the impact of the spectrum band slope and the probe beam character on the measurement sensitivity are detailed studied. Experiments are performed with a highly reflective coating. The results show that the measurement sensitivity is determined by the structure and the optical-thermal parameters. Appropriate wavelength, incident angle and polarization properties of the probe beam can improve the measurement sensitivity. The results provide a theoretical and experimental basis for the application of the photothermal detuning technique for absorption loss of the thin film. © 2011 Elsevier GmbH. |
英文摘要 | The photothermal detuning technique (PTDT) is a novel photothermal technique and can be used to measure the absorption of the optical coatings, which utilizes the spectral shift of optical coatings caused by absorption-induced temperature rise. The measurement sensitivity depends on the slope of the spectrum band edge and the character of the probe beam, and is limited by the temperature coefficient of the reflectivity or transmission. Based on the preliminary study, the impact of the spectrum band slope and the probe beam character on the measurement sensitivity are detailed studied. Experiments are performed with a highly reflective coating. The results show that the measurement sensitivity is determined by the structure and the optical-thermal parameters. Appropriate wavelength, incident angle and polarization properties of the probe beam can improve the measurement sensitivity. The results provide a theoretical and experimental basis for the application of the photothermal detuning technique for absorption loss of the thin film. © 2011 Elsevier GmbH. |
学科主题 | Absorption - Coatings - Probes - Reflective coatings |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000315312800015 |
源URL | [http://ir.ioe.ac.cn/handle/181551/6629] ![]() |
专题 | 光电技术研究所_薄膜光学技术研究室(十一室) |
作者单位 | 1.College of Electronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China 2.Institute of Optics and Electronics, Chinese Academy of Sciences, P.O. Box 350, Shuangliu, Chengdu, Sichuan 610209, China |
推荐引用方式 GB/T 7714 | Hao, Honggang,Rao, Min,Zhou, Ao,et al. Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique[J]. Optik,2013,124(3):250-254. |
APA | Hao, Honggang,Rao, Min,Zhou, Ao,Yin, Bo,&Li, Bincheng.(2013).Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique.Optik,124(3),250-254. |
MLA | Hao, Honggang,et al."Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique".Optik 124.3(2013):250-254. |
入库方式: OAI收割
来源:光电技术研究所
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