High density print circuit board line width measurement algorithm based on statistical process control theory
文献类型：期刊论文
| 作者 | Zhang, Jing1; Ye, Yutang1; Xie, Yu1; Liu, Lin1; Chang, Yongxin1,2; Luo, Ying1; Qiu, Lianxiao3 |
| 刊名 | Optik
 |
| 出版日期 | 2013 |
| 卷号 | 124期号:20页码:4472-4476 |
| ISSN号 | 00304026 |
| 通讯作者 | Zhang, J. (zhangjing619@gmail.com) |
| 中文摘要 | The high-density circuit board width detection algorithms are proposed. The detection algorithms include the pre-processing algorithm of measured image line width and the final detection algorithm. The noise suppression of morphological erosion operator based on partial differential equations (PDE) is presented. The mathematical statistical methods and clustering segmentation edge are utilized to measure the upper and lower line width of high-density circuit board with sub-pixel fit to improve detection accuracy. Experiments show that the algorithm can accurately measure the line width distance of circuit board. And measure system analysis results show that the measured data accord with the statistical process control theory and are significant for guiding practice. © 2013 Elsevier GmbH. |
| 英文摘要 | The high-density circuit board width detection algorithms are proposed. The detection algorithms include the pre-processing algorithm of measured image line width and the final detection algorithm. The noise suppression of morphological erosion operator based on partial differential equations (PDE) is presented. The mathematical statistical methods and clustering segmentation edge are utilized to measure the upper and lower line width of high-density circuit board with sub-pixel fit to improve detection accuracy. Experiments show that the algorithm can accurately measure the line width distance of circuit board. And measure system analysis results show that the measured data accord with the statistical process control theory and are significant for guiding practice. © 2013 Elsevier GmbH. |
| 学科主题 | Algorithms - Partial differential equations - Signal detection - Statistical process control - Systems analysis |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000325445100089 |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/5072]  |
| 专题 | 光电技术研究所_光电探测与信号处理研究室（五室） |
| 作者单位 | 1.Opt-electric Information School, University of Electronic Science and Technology, Chengdu 610054, China 2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China 3.School of Computer Science and Technology, Huazhong University of Science and Technology, 410074, China |
| 推荐引用方式 GB/T 7714 | Zhang, Jing,Ye, Yutang,Xie, Yu,et al. High density print circuit board line width measurement algorithm based on statistical process control theory[J]. Optik,2013,124(20):4472-4476. |
| APA | Zhang, Jing.,Ye, Yutang.,Xie, Yu.,Liu, Lin.,Chang, Yongxin.,...&Qiu, Lianxiao.(2013).High density print circuit board line width measurement algorithm based on statistical process control theory.Optik,124(20),4472-4476. |
| MLA | Zhang, Jing,et al."High density print circuit board line width measurement algorithm based on statistical process control theory".Optik 124.20(2013):4472-4476. |
入库方式： OAI收割
来源：光电技术研究所
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