Discussion on a method of target's infrared feature extraction
文献类型：会议论文
| 作者 | Tian, Wenxing1,2; Li, Qiang1; Fu, Jingneng1; Cui, Lanfang1,2 |
| 出版日期 | 2014 |
| 会议名称 | Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment |
| 会议日期 | 2014 |
| 卷号 | 9282 |
| 页码 | 92823A |
| 通讯作者 | Tian, Wenxing |
| 中文摘要 | Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target's infrared signal. Optimization model can be obtained by matching the theoretical formula of target's irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods. © 2014 SPIE. |
| 英文摘要 | Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target's infrared signal. Optimization model can be obtained by matching the theoretical formula of target's irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods. © 2014 SPIE. |
| 收录类别 | EI |
| 学科主题 | Feature extraction - Manufacture - Optical testing - Optimization |
| 语种 | 英语 |
| ISSN号 | 0277786X |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/7492]  |
| 专题 | 光电技术研究所_应用光学研究室（二室） |
| 作者单位 | 1.Lab of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China 2.University of Chinese Academy of Sciences, Beijing, China |
| 推荐引用方式 GB/T 7714 | Tian, Wenxing,Li, Qiang,Fu, Jingneng,et al. Discussion on a method of target's infrared feature extraction[C]. 见:Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2014. |
入库方式： OAI收割
来源：光电技术研究所
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