中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering

文献类型:期刊论文

作者Jiang JL(姜金龙)1,2; Wang, Yubao1; Du, Jinfang1; Yang, Hua1; Hao JY(郝俊英)3; Hao JY(郝俊英)
刊名Applied Surface Science
出版日期2016
卷号379页码:516-522
关键词a-C:H:Si films Magnetron sputtering Structure Tribological properties
ISSN号0169-4332
通讯作者姜金龙 ; 郝俊英
英文摘要

The silicon doped hydrogenated amorphous carbon (a-C:H:Si) films were prepared on silicon substrates by middle-frequency magnetron sputtering silicon target in an argon and methane gas mixture atmosphere. The deposition rate, chemical composition, structure, surface properties, stress, hardness and tribological properties in the ambient air of the films were systemically investigated using X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM), atomic force microscopy (AFM), nanoindentation and tribological tester. The results show that doped silicon content in the films is controlled in the wide range from 39.7 at.% to 0.2 at.% by various methane gas flow rate, and methane flow rate affects not only the silicon content but also its chemical bonding structure in the films due to the transformation of sputtering modes. Meanwhile, the sp3 carbon component in the films linearly increases with increasing of methane flow rate. The film deposited at moderate methane flow rate of 40–60 sccm exhibits the very smooth surface (RMS roughness 0.4 nm), low stress (0.42 GPa), high hardness (21.1 GPa), as well as low friction coefficient (0.038) and wear rate (1.6 × 10−7 mm3/Nm). The superior tribological performance of the films could be attributed to the formation and integral covering of the transfer materials on the sliding surface and their high hardness.

学科主题材料科学与物理化学
收录类别SCI
资助信息the National Natural Science Foundation of China (Grant No. 51105186)
语种英语
WOS记录号WOS:000376819300068
源URL[http://210.77.64.217/handle/362003/19961]  
专题兰州化学物理研究所_固体润滑国家重点实验室
通讯作者Hao JY(郝俊英)
作者单位1.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Lanzhou 730050, Peoples R China
2.Lanzhou Univ Technol, Sch Sci, Lanzhou 730050, Peoples R China
3.Chinese Acad Sci, Lanzhou Inst Chem Phys, State Key Lab Solid Lubricat, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Jiang JL,Wang, Yubao,Du, Jinfang,et al. Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering[J]. Applied Surface Science,2016,379:516-522.
APA Jiang JL,Wang, Yubao,Du, Jinfang,Yang, Hua,Hao JY,&郝俊英.(2016).Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering.Applied Surface Science,379,516-522.
MLA Jiang JL,et al."Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering".Applied Surface Science 379(2016):516-522.

入库方式: OAI收割

来源:兰州化学物理研究所

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