中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films Sipeng Gu(顾四朋)(Shanghai Institute of Optics and

文献类型:期刊论文

作者顾四朋; 侯立松; 赵启涛; 黄瑞安
刊名Chin. Opt. Lett.
出版日期2003
卷号1期号:12页码:716
英文摘要To improve the optical storage performance, Sn was doped into Ge2Sb2Te5 phase change thin films. The optical and thermal properties of Sn-doped Ge2Sb2Te5 film were investigated. The crystal structures of the as-sputtered and the annealed films were identified by the X-ray diffraction (XRD) method. The differential scanning calorimeter (DSC) method is used to get the crystallization temperature and crystallization energy (Ea). It was found that proper Sn-doping could highly improve storage performance of the Ge2Sb2Te5 media.
收录类别EI
语种英语
版本出版稿
源URL[http://ir.siom.ac.cn/handle/181231/18382]  
专题上海光学精密机械研究所_高密度光存储技术实验室
作者单位1.Gu Sipeng, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, ShangHai 201800, China.
2.Hou Lisong, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, ShangHai 201800, China.
3.Zhao Qitao, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, ShangHai 201800, China.
4.Huang Rui'an, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, ShangHai 201800, China.
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GB/T 7714
顾四朋,侯立松,赵启涛,等. Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films Sipeng Gu(顾四朋)(Shanghai Institute of Optics and[J]. Chin. Opt. Lett.,2003,1(12):716.
APA 顾四朋,侯立松,赵启涛,&黄瑞安.(2003).Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films Sipeng Gu(顾四朋)(Shanghai Institute of Optics and.Chin. Opt. Lett.,1(12),716.
MLA 顾四朋,et al."Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films Sipeng Gu(顾四朋)(Shanghai Institute of Optics and".Chin. Opt. Lett. 1.12(2003):716.

入库方式: OAI收割

来源:上海光学精密机械研究所

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