平晶谱仪谱线波长的直接标定
文献类型：期刊论文
| 作者 | 刘智; 李儒新; 贾天卿; 邓蕴沛; 范品忠; 曾志男; 徐至展 |
| 刊名 | 中国激光
 |
| 出版日期 | 2003 |
| 卷号 | 30期号:2页码:167 |
| 其他题名 | New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability |
| 中文摘要 | 提出一种简便的新方法用以实现X射线平晶谱仪谱线波长的直接标定，只需在谱仪晶体表面加上一个特制的辅助光阑，即可在不知光源位置和没有任何参考谱线的情况下精确标定谱线的波长。 |
| 英文摘要 | A novel method of measuring absolute X-ray wavelengths using an auxiliary diaphragm attached to the planar crystal, which can accurately determine wavelengths without any reference line and any information or special position. |
| 收录类别 | EI |
| 语种 | 中文 |
| 版本 | 出版稿 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/18386]  |
| 专题 | 上海光学精密机械研究所_强场激光物理国家重点实验室 |
| 作者单位 | 1.Liu Zhi, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 2.Li Ruxin, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 3.Jia Tianqing, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 4.Deng Yunpei, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 5.Fan Pinzhong, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 6.Zeng Zhinan, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. 7.Xu Zhizhan, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China. |
| 推荐引用方式 GB/T 7714 | 刘智,李儒新,贾天卿,等. 平晶谱仪谱线波长的直接标定[J]. 中国激光,2003,30(2):167. |
| APA | 刘智.,李儒新.,贾天卿.,邓蕴沛.,范品忠.,...&徐至展.(2003).平晶谱仪谱线波长的直接标定.中国激光,30(2),167. |
| MLA | 刘智,et al."平晶谱仪谱线波长的直接标定".中国激光 30.2(2003):167. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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