Ultrafast UV laser-induced dynamics in fused silica
文献类型：会议论文
| 作者 | Du, Juan; Xue, Bing; Liu, Jun; Li, Zehan; Kobayashi, Takayoshi; Zhao, Yuanan; Leng, Yuxin |
| 出版日期 | 2014 |
| 会议名称 | spie laser damage - 46th annual symposium on optical materials for high power lasers |
| 通讯作者 | du, j (reprint author), chinese acad sci, shanghai inst opt & fine mech, state key lab high field laser phys, shanghai 201800, peoples r china. |
| 英文摘要 | using 9 fs uv laser pulses, laser induced ultrafast dynamics in fused silica is investigated in the present study. the free carrier dynamics under few-cycle uv laser excitation far below laser damage threshold in the fused silica was studied. after laser excitation, free carrier in the conductive band is found to turn into self-trapped excitons within about 300fs. it is possible that the trapped exciton will result in the incubation effect under the condition of ultrafast high-frequency pulsed uv laser exposure. |
| 收录类别 | CPCI |
| 会议录 | laser-induced damage in optical materials: 2014
 |
| 会议录出版者 | spie-int soc optical engineering |
| 语种 | 英语 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/17198]  |
| 专题 | 上海光学精密机械研究所_强场激光物理国家重点实验室 |
| 作者单位 | 1.[Du, Juan 2.Liu, Jun 3.Leng, Yuxin] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, State Key Lab High Field Laser Phys, Shanghai 201800, Peoples R China |
| 推荐引用方式 GB/T 7714 | Du, Juan,Xue, Bing,Liu, Jun,et al. Ultrafast UV laser-induced dynamics in fused silica[C]. 见:spie laser damage - 46th annual symposium on optical materials for high power lasers. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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