中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
3D shape measurement of a ground surface optical element using band-pass random patterns projection

文献类型:期刊论文

作者Liu, Kun; Zhou, Changhe; Wang, Shaoqing; Wei, Shengbin; Fan, Xin
刊名chin. opt. lett.
出版日期2015
卷号13期号:8页码:81101
通讯作者zhou, ch (reprint author), univ chinese acad sci, shanghai inst opt & fine mech, lab informat opt & optoelect tech, shanghai 201800, peoples r china.
英文摘要for manufacturing a fine optical glass lens, it is important to obtain a 3d profile of a semi-finished product with a rough surface. we develop an active binocular 3d scanning setup to measure the 3d profile of a rough surface optical element. two cameras simultaneously capture the band-pass binary random patterns which are projected on the target object. the highlight of this system is using the temporal correlation technique to determine the stereo correspondence between the pixels of the two cameras. the 3d point cloud can be reconstructed by the triangulation principle. experiment results confirmed that this method effectively measures the rough surface of an optical element with sufficient accuracy.
收录类别SCI
语种英语
版本出版稿
源URL[http://ir.siom.ac.cn/handle/181231/14190]  
专题上海光学精密机械研究所_信息光学与光电技术实验室
作者单位1.[Liu, Kun
2.Zhou, Changhe
3.Wang, Shaoqing
4.Wei, Shengbin
5.Fan, Xin] Univ Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Informat Opt & Optoelect Tech, Shanghai 201800, Peoples R China
推荐引用方式
GB/T 7714
Liu, Kun,Zhou, Changhe,Wang, Shaoqing,et al. 3D shape measurement of a ground surface optical element using band-pass random patterns projection[J]. chin. opt. lett.,2015,13(8):81101.
APA Liu, Kun,Zhou, Changhe,Wang, Shaoqing,Wei, Shengbin,&Fan, Xin.(2015).3D shape measurement of a ground surface optical element using band-pass random patterns projection.chin. opt. lett.,13(8),81101.
MLA Liu, Kun,et al."3D shape measurement of a ground surface optical element using band-pass random patterns projection".chin. opt. lett. 13.8(2015):81101.

入库方式: OAI收割

来源:上海光学精密机械研究所

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