Depth resolution enhancement in double-detection optical scanning holography
文献类型：期刊论文
| 作者 | Ou, Haiyan; Poon, Ting-Chung; Wong, Kenneth K. Y.; Lam, Edmund Y. |
| 刊名 | appl. optics
 |
| 出版日期 | 2013 |
| 卷号 | 52期号:13页码:3079 |
| 通讯作者 | lam, ey (reprint author), univ hong kong, dept elect & elect engn, pokfulam rd, hong kong, hong kong, peoples r china. |
| 英文摘要 | we propose an optical scanning holography system with enhanced axial resolution using two detections at different depths. by scanning the object twice, we can obtain two different sets of fresnel zone plates to sample the same object, which in turn provides more information for the sectional image reconstruction process. we develop the computation algorithm that makes use of such information, solving a constrained optimization problem using the conjugate gradient method. simulation results show that this method can achieve a depth resolution up to 1 mu m. (c) 2013 optical society of america |
| 收录类别 | SCI |
| 语种 | 英语 |
| 版本 | 出版稿 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/14645]  |
| 专题 | 上海光学精密机械研究所_信息光学与光电技术实验室 |
| 作者单位 | 1.[Ou, Haiyan 2.Wong, Kenneth K. Y. 3.Lam, Edmund Y.] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China 4.[Ou, Haiyan] Univ Elect Sci & Technol China, Inst Appl Phys, Chengdu 610054, Peoples R China 5.[Poon, Ting-Chung] Virginia Tech, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA 6.[Poon, Ting-Chung] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech SIOM, Shanghai 201800, Peoples R China |
| 推荐引用方式 GB/T 7714 | Ou, Haiyan,Poon, Ting-Chung,Wong, Kenneth K. Y.,et al. Depth resolution enhancement in double-detection optical scanning holography[J]. appl. optics,2013,52(13):3079. |
| APA | Ou, Haiyan,Poon, Ting-Chung,Wong, Kenneth K. Y.,&Lam, Edmund Y..(2013).Depth resolution enhancement in double-detection optical scanning holography.appl. optics,52(13),3079. |
| MLA | Ou, Haiyan,et al."Depth resolution enhancement in double-detection optical scanning holography".appl. optics 52.13(2013):3079. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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