基于单光弹调制器的米勒矩阵测量误差分析
文献类型：期刊论文
| 作者 | 曹绍谦; 步扬; 王向朝; 李思坤; 汤飞龙; 李中梁 |
| 刊名 | 光学学报
 |
| 出版日期 | 2013 |
| 卷号 | 33期号:6页码:612010 |
| 其他题名 | Measurement Error Analysis for Mueller Matrix Based on a Single Photo-Elastic Modulator |
| 通讯作者 | 曹绍谦, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. ; 步扬, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. ; 王向朝, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. ; 李思坤, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. ; 汤飞龙, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. ; 李中梁, 中国科学院上海光学精密机械研究所信息光学与光电技术实验室, 上海 201800, 中国. |
| 中文摘要 | 针对已有单光弹调制器米勒矩阵测量技术缺乏定量误差分析的不足,提出了单光弹调制器米勒矩阵测量误差方程,给出了相对误差分析方法,并结合矩阵条件数得到了降低米勒矩阵各元素最大相对误差的两组1/4波片方位角优化组合。实验结果表明,该两组1/4波片方位角优化组合,测量得到的待测1/4波片米勒矩阵各元素的最大相对误差分别为0.12%和0.20%,相比传统1/4波片方位角优化组合{-90°,-45°,30°,60°}条件下得到的各元素最大相对误差为0.83%,分别降低了85.54%和75.90%。 |
| 英文摘要 | A measurement error equation and a relative error analysis method for the Mueller matrix measurement technique based on a single photo-elastic modulator are proposed. Considering the relative error and the condition number, two optimum angle sets for the quarter-wave plate are obtained, which diminish the maximum relative error of each element of the Mueller matrix. The experimental results show that the maximum relative errors of each element of the Mueller matrix of the measured quarter-wave plate are 0.12% and 0.20% respectively by using the two optimum angle sets above. Compared to the maximum relative error of 0.83% of the traditional optimum angle sets {-90°,-45°,30°,60°} for the quarter-wave plate, the maximum relative errors of each element of the Mueller matrix of the measured quarter-wave plate are decreased by 85.54% and 75.90% respectively by using the two optimum angle sets above. |
| 收录类别 | EI |
| 语种 | 中文 |
| 版本 | 出版稿 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/14846]  |
| 专题 | 上海光学精密机械研究所_信息光学与光电技术实验室 |
| 作者单位 | 1.Cao Shaoqian, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. 2.Bu Yang, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. 3.Wang Xiangzhao, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. 4.Li Sikun, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. 5.Tang Feilong, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. 6.Li Zhongliang, Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. |
| 推荐引用方式 GB/T 7714 | 曹绍谦,步扬,王向朝,等. 基于单光弹调制器的米勒矩阵测量误差分析[J]. 光学学报,2013,33(6):612010. |
| APA | 曹绍谦,步扬,王向朝,李思坤,汤飞龙,&李中梁.(2013).基于单光弹调制器的米勒矩阵测量误差分析.光学学报,33(6),612010. |
| MLA | 曹绍谦,et al."基于单光弹调制器的米勒矩阵测量误差分析".光学学报 33.6(2013):612010. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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