光学元件应力测量研究
文献类型：学位论文
| 作者 | 谷耀辉 |
| 学位类别 | 硕士 |
| 答辩日期 | 2013 |
| 授予单位 | 中国科学院上海光学精密机械研究所 |
| 导师 | 朱健强 |
| 关键词 | 应力 偏振 光弹性 等倾线 等色线 |
| 其他题名 | Study on Stress Measurement of Optical Components |
| 中文摘要 | 应力是光学元件的一个重要参数，会对光学元件的光学性质，如折射率、均匀性和面形产生影响。在高功率激光装置中，光学元件是核心器件，其应力双折射会影响到激光器的输出性能和光束质量，在设计和优化过程中必须考虑应力因素。因此，光学元件应力测量研究是一项非常有意义的工作。 本论文的主要工作是首先分析应力的危害及其产生的原因，然后调研测量应力的方法，重点阐述光弹法测应力的原理，由应力—光学定律可知，光弹法是将求解主应力差的力学问题转化为求解相位延迟量或光程差的光学问题。对补偿法测量技术进行详细地理论推导，最后提出一种新的测量方法。本论文主要工作内容和创新点为： 1、本文的主要工作有：分析光学元件产生应力的原因和危害，着重介绍光弹法测应力的原理和优点，分析了等倾线和等差线形成的原因和区别。由Mueller矩阵出发，推导出补偿法原理的通用公式，根据此通用公式分析了两步移相法，三步移相法以及任意波片补偿法。全面分析了当补偿器为四分之一波片时，补偿法测量的原理，给出了涵盖该方法的光强真值表，概括了四分之一波片补偿法核心思想。 2、本文的主要创新点为：提出了相对角度法测量应力，它克服了传统测量方法中对光强极值位置的找寻，即降低了测量难度，又提高了测量精度。首先对此方法进行了理论推导，得出测量公式。然后在实验室搭建实验光路，实际测量了一个零级四分之一波片的相位延迟量，测量结果的平均值和标准差分别为90.072°和0.42°，很好的验证了此测量方法的有效性。最后对该测量方法进行了误差分析，结果表明此测量方法的误差源少且便于控制误差，具有很高测量精度。 |
| 英文摘要 | Stress is an important parameter of the optical element. It can affect the optical properties of the optical element, such as refractive index, uniformity and surface shape. In high power laser device, the optical element is a core component, and the stress birefringence will affect the performance and beam quality of the laser output. So in the design and optimization process, the stress must be taken into account. Therefore, studying on stress measurement of the laser optical element is very meaningful. In this thesis, the main job is to first analyze the hazards and the causes of stress, and then survey the methods of stress measurement. The author focuses on the principle of the photoelasticity method. And the compensation method is derived theoretically in detail. Finally, a new measurement method is proposed. In this thesis, the main work is as follows. (1) The main work of this thesis is as follows. Through reading the literature, to find the dangers to the system device when there is stress in the optical elements, how the stress generates and how to control it. Then the author makes a survey of stress measurement methods. At last, the photoelasticity method with non-destructive stress measurement is selected. There is a brief introduction to the history and characteristics of the photoelasticity method. The principle and method of analysis of the photoelasticity method is elaborated. It’s explained clearly the differences and relations of the isocline and isochromatic. The compensation method is used frequently. The general formula of the principle of compensation law is derived by Mueller matrix. According to this general formula, the two-step phase shift method, the three-step phase shift method and the arbitrary wave-plate compensation are proposed. Then according to a comprehensive analysis of the compensation when the compensator is quarter-wave plate, a truth table is given. The table can summarizes the core idea of quarter-wave plate compensation method. (2) The main innovation of this thesis is as follows. A relative angle method for measuring the stress of optical elements is presented. Although it’s difficult to accurately determine the extinction position, this method has nothing to do with it. Compared with traditional methods, there is no need to find the extreme value positions to adjust the azimuth angle of the optical elements. And this method can eliminate the influence of positioning error on the measurement results. This method not only reduces the difficulty of the measurement, but also improves the accuracy of the measurement. Based on Mueller matrix, the theory of this method as well as the measurement formula is derived. The usefulness of this method is verified by the result of the experiment. |
| 语种 | 中文 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/16756]  |
| 专题 | 上海光学精密机械研究所_学位论文 |
| 推荐引用方式 GB/T 7714 | 谷耀辉. 光学元件应力测量研究[D]. 中国科学院上海光学精密机械研究所. 2013. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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