中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of deposition rate on interface width of Mo/Si multilayers

文献类型:期刊论文

作者Zhao, Jiaoling; Yi, Kui; Wang, Hu; Fang, Ming; Wang, Bin; Hu, Guohang; He, Hongbo
刊名thin solid films
出版日期2015
卷号592页码:256
通讯作者he, hb (reprint author), chinese acad sci, shanghai inst opt & fine mech siom, key lab mat high power laser, shanghai 201800, peoples r china.
英文摘要the application of high-reflectance mo/si multilayers in extreme ultraviolet (euv) lithography does not only require high normal-incidence reflectivity but also long lifetime. in this paper, the microstructure of multilayers has been studied by means of x-ray reflectivity, x-ray diffraction, atomic force microscopy, and transmission electron microscopy. the interface width of mo/si multilayers is strongly influenced by the deposition rate. the interface width increases with the deposition rate. thereafter the reflectivity decreases and bandwidth narrows down. lower deposition rate is required to fabricate high quality mo/si multilayers according to our results. our findings are beneficial to improve the reflectivity of mo/si multilayer mirrors by reducing the interface width with proper deposition rate. (c) 2015 elsevier b.v. all rights reserved.
收录类别SCI
语种英语
版本出版稿
源URL[http://ir.siom.ac.cn/handle/181231/14307]  
专题上海光学精密机械研究所_中科院强激光材料重点实验室
作者单位1.[Zhao, Jiaoling
2.Yi, Kui
3.Wang, Hu
4.Fang, Ming
5.Wang, Bin
6.Hu, Guohang
7.He, Hongbo] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech SIOM, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
8.[Zhao, Jiaoling
9.Wang, Hu
10.Wang, Bin] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Zhao, Jiaoling,Yi, Kui,Wang, Hu,et al. Influence of deposition rate on interface width of Mo/Si multilayers[J]. thin solid films,2015,592:256.
APA Zhao, Jiaoling.,Yi, Kui.,Wang, Hu.,Fang, Ming.,Wang, Bin.,...&He, Hongbo.(2015).Influence of deposition rate on interface width of Mo/Si multilayers.thin solid films,592,256.
MLA Zhao, Jiaoling,et al."Influence of deposition rate on interface width of Mo/Si multilayers".thin solid films 592(2015):256.

入库方式: OAI收割

来源:上海光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。