A new probe into thin copper sulfide counter electrode with thickness below 100 nm for quantum dot-sensitized solar cells
文献类型：期刊论文
| 作者 | Rui Xia1; Shimao Wang1; Weiwei Dong1,2; Xiaodong Fang1,2,3; Linhua Hu2; Jun Zhu2; Fang, Xiaodong ; Hu, Linhua; Wang, Shimao
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| 刊名 | electrochimica acta
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| 出版日期 | 2016 |
| 卷号 | 205期号:无页码:45-52 |
| 源URL | [http://ir.hfcas.ac.cn/handle/334002/21232]  |
| 专题 | 合肥物质科学研究院_中科院安徽光学精密机械研究所 |
| 作者单位 | 1.Anhui Provincial Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China 2.Key Lab of Novel Thin Film Solar Cells, Chinese Academy of Sciences, Hefei 230031, China 3.School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China |
| 推荐引用方式 GB/T 7714 | Rui Xia,Shimao Wang,Weiwei Dong,et al. A new probe into thin copper sulfide counter electrode with thickness below 100 nm for quantum dot-sensitized solar cells[J]. electrochimica acta,2016,205(无):45-52. |
| APA | Rui Xia.,Shimao Wang.,Weiwei Dong.,Xiaodong Fang.,Linhua Hu.,...&Wang, Shimao.(2016).A new probe into thin copper sulfide counter electrode with thickness below 100 nm for quantum dot-sensitized solar cells.electrochimica acta,205(无),45-52. |
| MLA | Rui Xia,et al."A new probe into thin copper sulfide counter electrode with thickness below 100 nm for quantum dot-sensitized solar cells".electrochimica acta 205.无(2016):45-52. |
入库方式： OAI收割
来源：合肥物质科学研究院
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