Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry
文献类型：期刊论文
| 作者 | Chen ZM(陈志敏) ; Wu YQ(吴谊群) ; Gu DH(顾冬红) ; Gan FX(干福熹) |
| 刊名 | appl. phys. a-mater. sci. process.
 |
| 出版日期 | 2007 |
| 卷号 | 88期号:2页码:409 |
| 关键词 | Dielectric functions Optical glass substrates Absorption coefficients |
| ISSN号 | 0947-8396 |
| 中文摘要 | thin films of four nickel(ii) and copper(ii) hydrazone complexes, which will hopefully be used as recording layers for the next-generation of high-density recordable disks, were prepared by using the spin-coating method. absorption spectra of the thin films on k9 optical glass substrates in the 300-700 nm wavelength region were measured. optical constants (complex refractive indices n) and thickness d of the thin films prepared on single-crystal silicon substrates in the 275-675 nm wavelength region were investigated on a rotating analyzer-polarizer scanning ellipsometer by fitting the measured ellipsometric angles (psi(lambda) and delta(lambda)) with a 3-layer model (si/dye film/air). the dielectric functions epsilon and absorption coefficients alpha as a function of the wavelength were then calculated. additionally, a design to achieve high reflectivity and optimum dye film thickness with an appropriate reflective layer was performed with the film wizard software using a multilayered model (pc substrate/reflective layer/dye film/air) at 405 nm wavelength. |
| 学科主题 | 光存储 |
| 收录类别 | EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000247255800033 |
| 公开日期 | 2009-09-22 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/3959]  |
| 专题 | 上海光学精密机械研究所_高密度光存储技术实验室 |
| 推荐引用方式 GB/T 7714 | Chen ZM,Wu YQ,Gu DH,et al. Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry[J]. appl. phys. a-mater. sci. process.,2007,88(2):409, 414. |
| APA | 陈志敏,吴谊群,顾冬红,&干福熹.(2007).Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry.appl. phys. a-mater. sci. process.,88(2),409. |
| MLA | 陈志敏,et al."Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry".appl. phys. a-mater. sci. process. 88.2(2007):409. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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