A Z-scan model for optical nonlinear nanometric films
文献类型：期刊论文
| 作者 | Wei JS(魏劲松) ; Xiao Mufei |
| 刊名 | j. opt. a-pure appl. opt.
 |
| 出版日期 | 2008 |
| 卷号 | 10期号:11页码:115102 |
| 关键词 | Z-scan thin films nonlinear refractive index multi-interference nonlinear absorption |
| ISSN号 | 1464-4258 |
| 中文摘要 | the z-scan technique is useful for measuring the nonlinear refractive index of thin films. in conventional z-scan theories, two effects are often ignored, namely the losses due to the internal multi-interference and the nonlinear absorption inside the sample. therefore, the theories are restricted to relatively thick films. for films thinner than about 100 nm, the two effects become significant, and thus cannot be ignored. in the present work, we present a z-scan theory that takes both effects into account. the proposed model calculation is suitable for optical nonlinear films of nanometric thickness. with numerical simulations, we demonstrate dramatic deviations from the conventional z-scan calculations. |
| 学科主题 | 光存储 |
| 收录类别 | EI |
| 资助信息 | national natural science foundation of china [50772120, 60507009, 60490290]; shanghai key basic research [06dj14007]; chinese academy of sciences [kjcxzyw. nano. 06]; national basic research program of china [2007cb935400]; unam-dgapa mexico [in120406-3] |
| 语种 | 英语 |
| WOS记录号 | WOS:000260760400010 |
| 公开日期 | 2009-09-22 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/4061]  |
| 专题 | 上海光学精密机械研究所_高密度光存储技术实验室 |
| 推荐引用方式 GB/T 7714 | Wei JS,Xiao Mufei. A Z-scan model for optical nonlinear nanometric films[J]. j. opt. a-pure appl. opt.,2008,10(11):115102. |
| APA | 魏劲松,&Xiao Mufei.(2008).A Z-scan model for optical nonlinear nanometric films.j. opt. a-pure appl. opt.,10(11),115102. |
| MLA | 魏劲松,et al."A Z-scan model for optical nonlinear nanometric films".j. opt. a-pure appl. opt. 10.11(2008):115102. |
入库方式： OAI收割
来源：上海光学精密机械研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。