Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
文献类型：期刊论文
| 刊名 | Quality and Reliability Engineering International
 |
| 出版日期 | 2005 |
| 卷号 | 21期号:6页码:571-594 |
| 关键词 | LED failure mechanisms ageing tests lifetime distribution acceleration factor reliability |
| 语种 | 英语 |
| 源URL | [http://202.127.2.71:8080/handle/181331/10888]  |
| 专题 | 上海技术物理研究所_全文传递文献库_qwcd 期刊论文 |
| 推荐引用方式 GB/T 7714 | . Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests[J]. Quality and Reliability Engineering International,2005,21(6):571-594. |
| APA | (2005).Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests.Quality and Reliability Engineering International,21(6),571-594. |
| MLA | "Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests".Quality and Reliability Engineering International 21.6(2005):571-594. |
入库方式： OAI收割
来源：上海技术物理研究所
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