Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors
文献类型：期刊论文
| 刊名 | Siam Journal on Applied Mathematics
 |
| 出版日期 | 1993 |
| 卷号 | 53期号:1页码:187-204 |
| 关键词 | SEMICONDUCTORS LASER-BEAM INDUCED CURRENTS (LBIC) NONLINEAR ELLIPTIC SYSTEMS IDENTIFICATION PROBLEM |
| 语种 | 英语 |
| 源URL | [http://202.127.2.71:8080/handle/181331/11091]  |
| 专题 | 上海技术物理研究所_全文传递文献库_qwcd 期刊论文 |
| 推荐引用方式 GB/T 7714 | . Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors[J]. Siam Journal on Applied Mathematics,1993,53(1):187-204. |
| APA | (1993).Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors.Siam Journal on Applied Mathematics,53(1),187-204. |
| MLA | "Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors".Siam Journal on Applied Mathematics 53.1(1993):187-204. |
入库方式： OAI收割
来源：上海技术物理研究所
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