A CMOS Time-to-digital Converter LSI with Half-nanosecond Resolution Using a Ring Gate Delay Line
文献类型：期刊论文
| 刊名 | IEICE Transactions on Electronics
 |
| 出版日期 | 1993 |
| 卷号 | E76C期号:12页码:1774-1779 |
| 关键词 | TIME MEASUREMENT GATE DELAY INVERTER PHASE COMPARATOR A/D CONVERTER |
| 语种 | 英语 |
| 源URL | [http://202.127.2.71:8080/handle/181331/11282]  |
| 专题 | 上海技术物理研究所_全文传递文献库_qwcd 期刊论文 |
| 推荐引用方式 GB/T 7714 | . A CMOS Time-to-digital Converter LSI with Half-nanosecond Resolution Using a Ring Gate Delay Line[J]. IEICE Transactions on Electronics,1993,E76C(12):1774-1779. |
| APA | (1993).A CMOS Time-to-digital Converter LSI with Half-nanosecond Resolution Using a Ring Gate Delay Line.IEICE Transactions on Electronics,E76C(12),1774-1779. |
| MLA | "A CMOS Time-to-digital Converter LSI with Half-nanosecond Resolution Using a Ring Gate Delay Line".IEICE Transactions on Electronics E76C.12(1993):1774-1779. |
入库方式： OAI收割
来源：上海技术物理研究所
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