中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film

文献类型:期刊论文

作者Wei JS(魏劲松) ; Xiao M.
刊名appl. phys. b-lasers opt.
出版日期2008
卷号91期号:2页码:337
关键词Nonlinear thin films Numerical aperture Scanning laser microscopy
ISSN号0946-2171
中文摘要in a configuration of optical far-field scanning microscopy, super-resolution achieved by inserting a third-order optical nonlinear thin film is demonstrated and analyzed in terms of the frequency response function. without the thin film the microscopy is diffraction limited; thus, subwavelength features cannot be resolved. with the nonlinear thin film inserted, the resolution is dramatically improved and thus the microscopy resolves features significantly smaller than the smallest spacing allowed by the diffraction limit. a theoretical model is established and the device is analyzed for the frequency response function. the results show that the frequency response function exceeds the cutoff spatial frequency of the microscopy defined by the laser wavelength and the numerical aperture of the convergent lens. the main contribution to the improvement of the cutoff spatial frequency is from the phase change induced by the complex transmission of the nonlinear thin film. experimental results are presented and are shown to be consistent with the results of theoretical simulations.
学科主题光存储
收录类别EI
语种英语
WOS记录号WOS:000255392500022
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4063]  
专题上海光学精密机械研究所_高密度光存储技术实验室
推荐引用方式
GB/T 7714
Wei JS,Xiao M.. Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film[J]. appl. phys. b-lasers opt.,2008,91(2):337, 341.
APA 魏劲松,&Xiao M..(2008).Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film.appl. phys. b-lasers opt.,91(2),337.
MLA 魏劲松,et al."Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film".appl. phys. b-lasers opt. 91.2(2008):337.

入库方式: OAI收割

来源:上海光学精密机械研究所

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