中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Si underlayer induced nano-ablation in AgInSbTe thin films

文献类型:期刊论文

作者Jiao Xin-Bing ; Wei Jing-Song ; Gan Fu-Xi
刊名chin. phys. lett.
出版日期2008
卷号25期号:1页码:209
ISSN号0256-307x
中文摘要aginsbtelsi thin films on glass substrates are prepared by dc magnetron sputtering at room temperature. using si underlayer as the thermal diffusion layer, the super-resolution nano-ablation holes with a size of 70nm in the aginsbte phase change films are obtained by a far-field focused laser experimental setup, with laser wavelength 405nm and objective-lens numerical aperture 0.90. the nano-ablation formation mechanism is analysed and discussed via the thermal diffusion of sample structures.
学科主题光存储
语种英语
WOS记录号WOS:000252613500057
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4069]  
专题上海光学精密机械研究所_高密度光存储技术实验室
推荐引用方式
GB/T 7714
Jiao Xin-Bing,Wei Jing-Song,Gan Fu-Xi. Si underlayer induced nano-ablation in AgInSbTe thin films[J]. chin. phys. lett.,2008,25(1):209, 211.
APA Jiao Xin-Bing,Wei Jing-Song,&Gan Fu-Xi.(2008).Si underlayer induced nano-ablation in AgInSbTe thin films.chin. phys. lett.,25(1),209.
MLA Jiao Xin-Bing,et al."Si underlayer induced nano-ablation in AgInSbTe thin films".chin. phys. lett. 25.1(2008):209.

入库方式: OAI收割

来源:上海光学精密机械研究所

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